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Department of Physics
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G.J. Russell Microscopy Facility 

The GJ Russell Facility is the electron microscopy suite for the Faculty of Science, Durham University. We have state-of-the-art scanning electron microscopes (SEM), transmission electron microscopes (TEM) and focused ion-beam microscopes (FIB) that are accessible to staff and students from Physics, Chemistry, Earth Sciences, Engineering and Biology.

We also work extensively with industry and regional universities on routine characterisation as well as R&D projects. An example of our analytical capabilities is our work on Carbon-based nanostructures. These are used in a range of composite materials and are also being investigated for potential device applications. TEM and SEM provide a wealth of information about the material and their dependence on the processing conditions.

Scanning Microscope1

Ultra-High-Resolution Schottky Scanning Electron Microscope. Chemical analysis using energy dispersive X-ray (EDX) and Wavelength-dispersive X-ray spectroscopy (WDS). The cathodoluminescence (CL) detector allows users to characterise the optical and electronic properties of materials, and provides details of internal structures of fossils and cementation processes in sedimentary rocks

Scanning Microscope 2

An Environmental Electron Microscope. High contrast LaB6 environmental SEM allowing samples to be examined in their natural state under a range of conditions including very high water vapour up to 3000 Pa and high temperature (60 °C). Even for uncoated samples, the suite of variable pressure detectors available, offer outstanding imaging.

Focused Ion Beam Microscope

Dual Beam system - Electron beam column with fast blanking to perform lithography operations. Ga ion-beam column to perform imaging and milling/patterning operations separately.

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Links

Find out more about the Electron Microscopy facilities at Durham

Electron Microscopy Website

For further information about the facility, it's equipment, services and booking forms, visit the EMF website.
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