Staff profile

Research Interest and Biography

Research interests

My research interests centre around the use of x-ray scattering to probe the structure of materials and the history of science in the High Medieval period.

I have worked extensively on the effect of strain on the mechanical and electronic properties of semiconductors and the relationship between structure and magnetic properties of thin film materials used for magnetic devices in the recording industry. Experiments have been performed at the Diamond Light Source at Didcot near Oxford with collaborators from Dublin and Freiburg. A current project is to explore the possibilities of extracting oxygen from (simulated) lunar regolith.

I am a member of the interdisciplinary Ordered Universe project studying the scientific works of the 13th century polymath, Robert Grosseteste and collaborate with Professor Giles Gasper on studies of natural phenomena recorded in the 12th and 13th century chronicles.Recent peer-reviewed journal publications include:X-ray Diffraction Topography (Imaging) of Crystals Grown from Solution: A Short Review, B. K. Tanner, Crystal Growth and Design 23 (2023) 3026-3033 [doi.org/10.1021/acs.cgd.2c01463]‘In the shape of a cooking pot over the fire’: Records of Solar Prominences in the 1180s, G M Gasper and B K Tanner, Endeavour 47 (3) (2023), 100875 [doi.org/10.1016/j.endeavour.2023.100875]

Biography

Emeritus Professor Brian Tanner moved to Durham in 1973 as a University Lecturer, after holding a Junior Research Fellowship at Linacre College, Oxford.

Promoted to Senior Lecturer in 1983, Reader in 1986 and Professor in 1990, he served as Head of Durham University Physics Department from 1996-1999. From 1999-2000 he held a Sir James Knott Foundation Fellowship and from 2000-2001 he was a Leverhulme Research Fellow.

From 2000 part of his time was spent as Director of the North East Centre for Scientific Enterprise and subsequently as the Director of the University Technology Transfer Office. From 2008-2012 he was Dean of Knowledge Transfer in Durham University and from 2012 until his retirement in 2016 was its Dean for University Enterprise.

He has served on numerous Research Council committees and panels, and from 1998-2000 was chairman of a scientific review committee at the European Synchrotron Radiation Facility in Grenoble.In 1978 he co-founded a spin-off company, Bede Scientific Instruments Ltd that floated on the London Stock Exchange in November 2000 as Bede plc. Still based in Durham, it is now part of the Bruker Corporation.

From 2003 until 2015, Professor Tanner was a non-executive director of another spin-out from Durham which has become the Kromek Group plc, floating on the London Stock Exchange AIM market in October 2013.

In 2005 he was jointly awarded the Barrett Award of the Pennsylvania-based International Center for Diffraction Data and in 2012 he received the Queen’s Award for Enterprise Promotion.

He received the Gabor Prize and Medal of the Institute of Physics in 2014.

He was Chair of the County Durham Economic Partnership from 2012 to 2020.

He is an enthusiastic amateur musician, being an organist as well as a double bass player and Committee Chair with the New Tyneside Orchestra.

• X-ray scattering and magnetism
• Metallic multilayers
• Semiconductors and ceramics
• Medieval science

• 2017: Adjunct Professor Dublin City University: Visiting Chair in School of Electronic Engineering
• 2014: Gabor Medal and Prize: Gabor Medal and Prize of the Institute of Physics for distinguished work in the application of physics in an industrial, commercial or business context.
• 2012: Queen's Award for Enterprise Promotion: Queen's Award for Enterprise Promotion, National Honour, 2012
• 2005: Barrett Award of ICCD: Barrett Award of the International Center for Diffraction Data, Pennsylvania. (Jointly with Keith Bowen, FRS, FREng)

Chapter in book

• Commentary on the model of the world machine
  
  Tanner, B., McLeish, T., Sonnesyn, S., & Falk, S. (2023). Commentary on the model of the world machine. In G. E. M. Gasper, T. C. B. McLeish, S. Olsen Sønnesyn, & H. E. Smithson (Eds.), ’Mapping the Universe: Robert Grosseteste’s De sphera - On the Sphere (pp. 132-166). Oxford University Press.
• ‘Travelling Optics: Robert Grosseteste and the Optics behind the Rainbow’
  
  Gasper, G. E., Tanner, B. K., Sønnesyn, S. O., & El-Bizri, N. (2021). ‘Travelling Optics: Robert Grosseteste and the Optics behind the Rainbow’. In C. Etheridge & M. Campopiano (Eds.), Medieval Science in the North: Travelling Wisdom, 1000-1500 (pp. 45-75). Brepols Publishers.
• The legacy of Robert Grosseteste and the teaching of experimental physics to 14-16 year-olds in England
  
  Tanner, B., & Tanner, R. (2020). The legacy of Robert Grosseteste and the teaching of experimental physics to 14-16 year-olds in England. In J. Cunningham & S. Puttick (Eds.), Robert Grosseteste and the theory of learning: The ordered human (pp. 118-141). Routledge.
• The seven liberal arts: Commentary and Analysis
  
  Thomson, D., & Tanner, B. (2019). The seven liberal arts: Commentary and Analysis. In G. Gasper, C. Panti, T. McLeish, & H. Smithson (Eds.), Knowing and speaking: Robert Grosseteste’s De artibus liberalibus ’On the liberal arts’ and De generatione sonorum ’On the generation of sounds’ (pp. 448-482). Oxford University Press.
• Grazing Incidence X-Ray Reflectivity and Scattering
  
  Tanner, B. K. (2018). Grazing Incidence X-Ray Reflectivity and Scattering. In N. Ida & N. Meyendorf (Eds.), Handbook of Advanced Non-Destructive Evaluation (pp. 1-16). Springer Verlag. https://doi.org/10.1007/978-3-319-30050-4_16-1
• Unity and Symmetry in the De Luce of Robert Grosseteste
  
  Tanner, B., Bower, R., McLeish, T., & Gasper, G. (2016). Unity and Symmetry in the De Luce of Robert Grosseteste. In J. Cunningham & M. Hocknull (Eds.), Robert Grosseteste and the pursuit of Scientific Learning in the Middle-Ages (pp. 3-20). Springer Verlag. https://doi.org/10.1007/978-3-319-33468
• X-ray Scattering from Spintronic Structures
  
  Tanner, B. (2016). X-ray Scattering from Spintronic Structures. In Y. Xu, D. D. Awschalom, & J. Nitta (Eds.), Handbook of Spintronics (pp. 919-945). Springer Netherlands. https://doi.org/10.1007/978-94-007-6892-5_33
• Unity and Symmetry in the De Luce of Robert Grosseteste
  
  Tanner, B., Bower, R., McLeish, T., & Gasper, G. E. (2016). Unity and Symmetry in the De Luce of Robert Grosseteste. In J. P. Cunningham & M. Hocknull (Eds.), Robert Grosseteste and the Pursuit of Religious and Scientific learning in the Middle-Ages. (pp. 3-20). Springer Verlag. https://doi.org/10.1007/978-3-319-33468-4_1
• High Resolution X-ray Diffraction From Epitaxial Gallium Nitride Films
  
  Lafford, T., Loxley, N., & Tanner, B. (1997). High Resolution X-ray Diffraction From Epitaxial Gallium Nitride Films. In F. Ponce, T. Moustakas, I. Akasaki, & B. Monemar (Eds.), III-V Nitrides (pp. 483-488). Materials Research Society.
• Magnetization Process In Co/cr/co Trilayers With Ferro- And Antiferromagnetic Interlayer Coupling
  
  Niedoba, H., Mirecki, B., Thompson, S., Whiting, J., Ganot, F., Hase, T., Pape, I., & Tanner, B. (1997). Magnetization Process In Co/cr/co Trilayers With Ferro- And Antiferromagnetic Interlayer Coupling. In G. C. Hadjipanayis (Ed.), Magnetic hysteresis in novel magnetic materials. (pp. 549-553). KLUWER ACADEMIC PUBL.
• The Effect Of Carbon Content On The Magnetisation Of Steel
  
  Makar, J., & Tanner, B. (1996). The Effect Of Carbon Content On The Magnetisation Of Steel. In A. Moses & A. Basak (Eds.), Nonlinear Electromagnetic Systems (pp. 472-475). I O S PRESS.
• Contrast Of Defects In X-ray Diffraction Topographs
  
  Tanner, B. (1996). Contrast Of Defects In X-ray Diffraction Topographs. In A. Authier, S. Lagomarsino, & B. K. Tanner (Eds.), X-Ray and Neutron Dynamical Diffraction, Theory and Applications (pp. 147-166). PLENUM PRESS DIV PLENUM PUBLISHING CORP.
• Dislocation Distributions In Cd1-xhgxte/cdte And Cd(1-x) Hgxte/cd1-yznyte Grown By Liquid Phase Epitaxy
  
  Watson, C., Durose, K., Okeefe, E., Hudson, J., & Tanner, B. (1995). Dislocation Distributions In Cd1-xhgxte/cdte And Cd(1-x) Hgxte/cd1-yznyte Grown By Liquid Phase Epitaxy. In S. Baker, C. Ross, P. Townsend, C. Volkert, & P. Borgesen (Eds.), Thin Films: Stresses and Mechanical Properties V. (pp. 301-306). Materials Research Society.

Conference Paper

• In-situ synchrotron X-ray topography observation of double-ended Frank-Read sources in PVT-grown 4H-SiC wafers
  
  Yang, Y., Guo, J., Raghothamachar, B., Dudley, M., Welt, S., Danilewsky, A., McNally, P., & Tanner, B. (2018). In-situ synchrotron X-ray topography observation of double-ended Frank-Read sources in PVT-grown 4H-SiC wafers. In R. Stahlbush, P. Neudeck, A. Bhalla, R. Devaty, M. Dudley, & A. Lelis (Eds.), Silicon Carbide and Related Materials 2017 (pp. 172-175). Scientific.net. https://doi.org/10.4028/www.scientific.net/msf.924
• Direct observation of stress relaxation process in 4H-SiC homoepitaxial layers via in-situ synchrotron X-ray topography
  
  Guo, J., Yang, Y., Raghothamachar, B., Dudley, M., Welt, S., Danilewsky, A., McNally, P., & Tanner, B. (2018). Direct observation of stress relaxation process in 4H-SiC homoepitaxial layers via in-situ synchrotron X-ray topography. In R. Stahlbush, P. Neudeck, A. Bhalla, R. Devaty, M. Dudley, & A. Lelis (Eds.), Silicon Carbide and Related Materials 2017 (pp. 176-179). Scientific.net. https://doi.org/10.4028/www.scientific.net/msf.924
• Nondestructive, In Situ Mapping of Die Surface Displacements in Encapsulated IC Chip Packages Using X-Ray Diffraction Imaging Techniques
  
  Gorji, N., Tanner, B., Vijayaraghavan, R., Danilewsky, A., & McNally, P. (2017). Nondestructive, In Situ Mapping of Die Surface Displacements in Encapsulated IC Chip Packages Using X-Ray Diffraction Imaging Techniques. Presented at 2017 IEEE 67th Electronic Components and Technology Conference (ECTC). https://doi.org/10.1109/ectc.2017.175
• Direct, Independent Measurement Of Twist And Tilt Mosaic As A Function Of Thickness In Epitaxial Gan
  
  Lafford, T., Parbrook, P., & Tanner, B. (2002). Direct, Independent Measurement Of Twist And Tilt Mosaic As A Function Of Thickness In Epitaxial Gan. In A. Hoffmann & A. Rizzi (Eds.), Proceedings of the International Workshop on Nitride Semiconductors (pp. 542-545). Wiley-VCH Verlag.
• Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers
  
  Cockerton, S., Cooke, M., Bowen, D., & Tanner, B. (1996). Combined Room Temperature Photoluminescence And High Resolution X-ray Diffraction Mapping Of Semiconductor Wafers (S. Pang, O. Glembocki, F. Pollak, F. Celii, & C. SotomayorTorres, Eds.). Materials Research Society.
• New Algorithms For Rapid Full-wafer Mapping By High-resolution Double Axis X-ray-diffraction
  
  Loxley, N., Cockerton, S., Cooke, L., Gray, T., Tanner, B., & Bowen, D. (1994). New Algorithms For Rapid Full-wafer Mapping By High-resolution Double Axis X-ray-diffraction. In O. Glembocki, S. Pang, F. Pollak, G. Crean, & G. Larrabee (Eds.), Materials Research Society Symposium Proceedings (pp. 451-456). Materials Research Society.
• Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale
  
  Wormington, M., Sakurai, K., Bowen, D., & Tanner, B. (1994). Grazing Incidence X-ray Reflectance Measurement Of Surface And Interface Roughness On The Sub-nanometre Scale. In M. Sarikaya, H. Wickramasinghe, & M. Isaacson (Eds.), Materials Research Society Symposium Proceedings. (pp. 525-530). Materials Research Society. https://doi.org/10.1557/proc-332-525
• A Grazing-incidence X-ray Reflectometer For Rapid Nondestructive Characterization Of Thin-films And Interfaces
  
  Loxley, N., Monteiro, A., Cooke, M., Bowen, D., & Tanner, B. (1992). A Grazing-incidence X-ray Reflectometer For Rapid Nondestructive Characterization Of Thin-films And Interfaces (S. Pearton, D. Sadana, & J. Zavada, Eds.). Materials Research Society. https://doi.org/10.1557/proc-240-219

Journal Article

• “In the shape of a cooking pot over the fire”: Records of solar prominences in the 1180s
  
  Gasper, G. E., & Tanner, B. K. (2023). “In the shape of a cooking pot over the fire”: Records of solar prominences in the 1180s. Endeavour, 47(3), Article 100875. https://doi.org/10.1016/j.endeavour.2023.100875
• A cooking pot lit by fire
  
  Gasper, G. E. M., & Tanner, B. K. (2023). A cooking pot lit by fire. Astronomy & Geophysics, 64(1), 1.36-1.37. https://doi.org/10.1093/astrogeo/atac091
• X-ray Diffraction Topography (Imaging) of Crystals Grown from Solution: A Short Review
  
  Tanner, B. K. (2023). X-ray Diffraction Topography (Imaging) of Crystals Grown from Solution: A Short Review. Crystal Growth & Design, 23(4), 3026-3033. https://doi.org/10.1021/acs.cgd.2c01463
• X-ray diffraction imaging of fully packaged n–p–n transistors under accelerated ageing conditions
  
  Tanner, B. K., Danilewsky, A., & McNally, P. J. (2022). X-ray diffraction imaging of fully packaged n–p–n transistors under accelerated ageing conditions. Journal of Applied Crystallography, 55(5), 1139-1146. https://doi.org/10.1107/s1600576722007142
• A Marvellous Sign and A Fiery Globe: A Medieval English Report of Ball Lightning
  
  Gasper, G. E., & Tanner, B. K. (2022). A Marvellous Sign and A Fiery Globe: A Medieval English Report of Ball Lightning. Weather, 77(7), 232-234. https://doi.org/10.1002/wea.4144
• X-ray imaging of silicon die within fully packaged semiconductor devices
  
  Tanner, B. K., McNally, P. J., & Danilewsky, A. N. (2021). X-ray imaging of silicon die within fully packaged semiconductor devices. Powder Diffraction, 36(2), 78-84. https://doi.org/10.1017/s088571562100021x
• Magnifying Grains of Sand, Seeds, and Blades of Grass: Optical Effects in Robert Grosseteste’s De iride (On the Rainbow) (circa 1228–1230)
  
  White, R. C., Gasper, G. E., McLeish, T. C., Tanner, B. K., Harvey, J. S., Sønnesyn, S. O., Young, L. K., & Smithson, H. E. (2021). Magnifying Grains of Sand, Seeds, and Blades of Grass: Optical Effects in Robert Grosseteste’s De iride (On the Rainbow) (circa 1228–1230). Isis, 112(1), 93-107. https://doi.org/10.1086/713724
• Robert Grosseteste: A medieval thinker with a legacy for modern science.
  
  Tanner, B. K. (2021). Robert Grosseteste: A medieval thinker with a legacy for modern science. Istituto Lombardo - Accademia Di Scienze E Lettere - Rendiconti Di Scienze, 155. https://doi.org/10.4081/scienze.2021.767
• ‘The Moon Quivered Like a Snake’: A Medieval Chronicler, Lunar Explosions, and a Puzzle for Modern Interpretation
  
  Gasper, G. E., & Tanner, B. K. (2020). ‘The Moon Quivered Like a Snake’: A Medieval Chronicler, Lunar Explosions, and a Puzzle for Modern Interpretation. Endeavour, 44(4), Article 100750. https://doi.org/10.1016/j.endeavour.2021.100750
• In-Operando X-ray diffraction imaging of thermal strains in fully packaged silicon devices
  
  Tanner, B., Vijayaraghavan, R., Roarty, B., Danilewsky, A., & McNally, P. (2019). In-Operando X-ray diffraction imaging of thermal strains in fully packaged silicon devices. Microelectronics Reliability, 99, 232-238. https://doi.org/10.1016/j.microrel.2019.06.006
• Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon
  
  Tanner, B., Allen, D., Wittge, J., Danilewsky, A., Garagorri, J., Gorostegui-Colinas, E., Elizalde, M., & McNally, P. (2017). Quantitative Imaging of the Stress/Strain Fields and Generation of Macroscopic Cracks from Indents in Silicon. Crystals, 7(11), Article 347. https://doi.org/10.3390/cryst7110347
• Structural and optical properties of oxygen doped single crystal ZnTe grown by multi-tube physical vapour transport
  
  Mullins, J., Dierre, F., Halliday, D., Tanner, B., Radley, I., Kang, Z., & Summers, C. (2017). Structural and optical properties of oxygen doped single crystal ZnTe grown by multi-tube physical vapour transport. Journal of Materials Science: Materials in Electronics, 28(16), 11950-11960. https://doi.org/10.1007/s10854-017-7004-5
• Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages
  
  Tanner, B., Danilewsky, A., Vijayaraghavan, R., Cowley, A., & McNally, P. (2017). Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages. Journal of Applied Crystallography, 50(2), 547-554. https://doi.org/10.1107/s1600576717003132
• Bow-shaped Caustics from Conical Prisms: a 13th Century Account of Rainbow Formation from Robert Grosseteste’s De iride
  
  Harvey, J., Smithson, H., Siviour, C., Gasper, G. E., Sonnesyn, S. O., Tanner, B. K., & McLeish, T. (2017). Bow-shaped Caustics from Conical Prisms: a 13th Century Account of Rainbow Formation from Robert Grosseteste’s De iride. Applied Optics, 56(19), G197-G204. https://doi.org/10.1364/ao.56.00g197
• Twinning in vapour-grown, large volume Cd1-xZnxTe crystals
  
  Tanner, B., Mullins, J., Pym, A., & Maneuski, D. (2016). Twinning in vapour-grown, large volume Cd1-xZnxTe crystals. Journal of Crystal Growth, 448, 44-50. https://doi.org/10.1016/j.jcrysgro.2016.05.011
• Nondestructive Monitoring of Die Warpage in Encapsulated Chip Packages
  
  Bose, A., Vijayaraghavan, R., Cowley, A., Cherman, V., Tanner, B., Danilewsky, A., De Wolf, I., & McNally, P. (2016). Nondestructive Monitoring of Die Warpage in Encapsulated Chip Packages. IEEE Transactions on Components, Packaging, and Manufacturing Technology, 6(4), 653-662. https://doi.org/10.1109/tcpmt.2016.2527060
• Cracks observed to propagate discontinuously on the millisecond timescale
  
  Tanner, B. (2016). Cracks observed to propagate discontinuously on the millisecond timescale. IUCrJ, 3(2), 86-87. https://doi.org/10.1107/s2052252516002359
• X-ray asterism and the structure of cracks from indentations in silicon
  
  Tanner, B., Garagorri, J., Gorostegui-Colinas, E., Elizalde, M., Allen, D., McNally, P., Wittge, J., Ehlers, C., & Danilewsky, A. (2016). X-ray asterism and the structure of cracks from indentations in silicon. Journal of Applied Crystallography, 49(1), 250-259. https://doi.org/10.1107/s1600576715024620
• The Geometry of Catastrophic Fracture during High Temperature Processing of Silicon
  
  Tanner, B., Garagorri, J., Gorostegui-Colinas, E., Elizalde, M., Bytheway, R., McNally, P., & Danilewsky, A. (2015). The Geometry of Catastrophic Fracture during High Temperature Processing of Silicon. International Journal of Fracture, 195(1-2), 79-85. https://doi.org/10.1007/s10704-015-0050-1
• X-ray Diffraction Imaging of ZnTe Crystals Grown by the Multi-Tube Physical Vapour Transport Technique
  
  Mullins, J., Dierre, F., & Tanner, B. (2015). X-ray Diffraction Imaging of ZnTe Crystals Grown by the Multi-Tube Physical Vapour Transport Technique. Journal of Crystal Growth, 413, 61-66. https://doi.org/10.1016/j.jcrysgro.2014.12.007
• A medieval multiverse?: Mathematical modelling of the thirteenth century universe of Robert Grosseteste
  
  Bower, R., McLeish, T., Tanner, B., Smithson, H., Panti, C., Lewis, N., & Gasper, G. (2014). A medieval multiverse?: Mathematical modelling of the thirteenth century universe of Robert Grosseteste. Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, 470(2167), Article 40025. https://doi.org/10.1098/rspa.2014.0025
• Color-coordinate system from a 13th-century account of rainbows
  
  Smithson, H., Anderson, P., Dinkova-Bruun, G., Gasper, G., Laven, P., McLeish, T., Panti, C., & Tanner, B. (2014). Color-coordinate system from a 13th-century account of rainbows. Journal of the Optical Society of America A., 31(4), A341-A349. https://doi.org/10.1364/josaa.31.00a341
• History: A medieval multiverse
  
  McLeish, T. C., Bower, R. G., Tanner, B. K., Smithson, H. E., Panti, C., Lewis, N., & Gasper, G. E. (2014). History: A medieval multiverse. Nature, 507(7491), 161-163. https://doi.org/10.1038/507161a
• Crack propagation and fracture in silicon wafers under thermal stress
  
  Danilewsky, A., Wittge, J., Kiefl, K., Allen, D., McNally, P., Garagorri, J., Elizalde, M., Baumbach, T., & Tanner, B. (2013). Crack propagation and fracture in silicon wafers under thermal stress. Journal of Applied Crystallography, 46(4), 849-855. https://doi.org/10.1107/s0021889813003695
• In-situ grazing incidence x-ray diffraction measurements of relaxation in Fe/MgO/Fe epitaxial magnetic tunnel junctions during annealing
  
  Eastwood, D., Ali, M., Hickey, B., & Tanner, B. (2013). In-situ grazing incidence x-ray diffraction measurements of relaxation in Fe/MgO/Fe epitaxial magnetic tunnel junctions during annealing. Journal of Magnetism and Magnetic Materials, 348, 128-131. https://doi.org/10.1016/j.jmmm.2013.08.018
• X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers
  
  Tanner, B., Wittge, J., Vagovič, P., Baumbach, T., Allen, D., McNally, P., Bytheway, R., Jacques, D., Fossati, M., Bowen, D., Garagorri, J., Elizalde, M., & Danilewsky, A. (2013). X-ray diffraction imaging for predictive metrology of crack propagation in 450-mm diameter silicon wafers. Powder Diffraction, 28(02), 95-99. https://doi.org/10.1017/s0885715613000122
• Slip band distribution in rapid thermally annealed silicon wafers
  
  Garagorri, J., Elizalde, M., Fossati, M., Jacques, D., & Tanner, B. (2012). Slip band distribution in rapid thermally annealed silicon wafers. Journal of Applied Physics, 111(9), Article 094901. https://doi.org/10.1063/1.4709446
• Prediction of the propagation probability of individual cracks in brittle single crystal materials
  
  Tanner, B., Fossati, M., Garagorri, J., Elizalde, M., Allen, D., McNally, P., Jacques, D., Wittge, J., & Danilewsky, A. (2012). Prediction of the propagation probability of individual cracks in brittle single crystal materials. Applied Physics Letters, 101(4), Article 041903. https://doi.org/10.1063/1.4738994
• Growth by the Multi-tube Physical Vapour Transport method and characterisation of bulk (Cd,Zn)Te
  
  Choubey, A., Veeramani, P., Pym, A., Mullins, J., Sellin, P., Brinkman, A., Radley, I., Basu, A., & Tanner, B. (2012). Growth by the Multi-tube Physical Vapour Transport method and characterisation of bulk (Cd,Zn)Te. Journal of Crystal Growth, 352(1), 120-123. https://doi.org/10.1016/j.jcrysgro.2012.03.005
• Thermal slip sources at the extremity and bevel edge of silicon wafers
  
  Tanner, B., Wittge, J., Allen, D., Fossati, M., Danilwesky, A., McNally, P., Garagorri, J., Elizalde, M., & Jacques, D. (2011). Thermal slip sources at the extremity and bevel edge of silicon wafers. Journal of Applied Crystallography, 44(3), 489-494. https://doi.org/10.1107/s0021889811012088
• Polymeric spin-valves at room temperature
  
  Morley, N., Dhandapani, D., Rao, A., Al Qahtani, H., Gibbs, M., Grell, M., Eastwood, D., & Tanner, B. (2011). Polymeric spin-valves at room temperature. Synthetic Metals, 161(7-8), 558-562. https://doi.org/10.1016/j.synthmet.2010.11.011
• Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging
  
  Danilewsky, A., Wittge, J., Croell, A., Allen, D., McNally, P., Vagovic, P., Rolo, T., Li, Z., Baumbach, T., Gorostegui-Colinas, E., Garagorri, J., Elizalde, M., Fossati, M., Bowen, D., & Tanner, B. (2011). Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging. Journal of Crystal Growth, 318(1), 1157-1163. https://doi.org/10.1016/j.jaysgro.2010.10.199
• Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments
  
  Danilewsky, A., Wittge, J., Hess, A., Croll, A., Rack, A., Allen, D., McNally, P., Rolo, T., Vagovic, P., Baumbach, T., Garagorri, J., Elizalde, M., & Tanner, B. (2011). Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments. Physica Status Solidi (a), 208(11), 2499-2504. https://doi.org/10.1002/pssa.201184264
• Spin polarization and exchange coupling of Cu and Mn atoms in paramagnetic CuMn diluted alloys induced by a Co layer
  
  Abes, M., Atkinson, D., Tanner, B., Charlton, T., Langridge, S., Hase, T., Ali, M., Marrows, C., Hickey, B., Neudert, A., Hicken, R., Arena, D., Wilkins, S., Mirone, A., & Lebegue, S. (2010). Spin polarization and exchange coupling of Cu and Mn atoms in paramagnetic CuMn diluted alloys induced by a Co layer. Physical Review B, 82(18), Article 184412. https://doi.org/10.1103/physrevb.82.184412
• Ferromagnetism at the interfaces of antiferromagnetic FeRh epilayers
  
  Fan, R., Kinane, C., Charlton, T., Dorner, R., Ali, M., de Vries, M., Brydson, R., Marrows, C., Hickey, B., Arena, D., Tanner, B., Nisbet, G., & Langridge, S. (2010). Ferromagnetism at the interfaces of antiferromagnetic FeRh epilayers. Physical Review B, 82(18), Article 184418. https://doi.org/10.1103/physrevb.82.184418
• Dislocation sources and slip band nucleation from indents on silicon wafers
  
  Wittge, J., Danilewsky, A., Allen, D., McNally, P., Li, Z., Baumbach, T., Gorostegui-Colinas, E., Garagorri, J., Elizalde, M., Jacques, D., Fossati, M., Bowen, D., & Tanner, B. (2010). Dislocation sources and slip band nucleation from indents on silicon wafers. Journal of Applied Crystallography, 43(5), 1036-1039. https://doi.org/10.1107/s0021889810029894
• X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers
  
  Wittge, J., Danilewsky, A., Allen, D., McNally, P., Li, Z., Baumbach, T., Gorostegui-Colinas, E., Garagorri, J., Elizalde, M., Jacques, D., Fossati, M., Bowen, D., & Tanner, B. (2010). X-ray diffraction imaging of dislocation generation related to microcracks in Si wafers. Powder Diffraction, 25(2), 99-103. https://doi.org/10.1154/1.3392369
• Layer and interface structural changes in Co0.6Fe0.2B0.2/AlOx multilayers on annealing
  
  Pym, A., Ruhrig, M., & Tanner, B. (2010). Layer and interface structural changes in Co0.6Fe0.2B0.2/AlOx multilayers on annealing. Journal of Applied Physics, 107(9), Article 093524. https://doi.org/10.1063/1.3366707
• The spin polarization of Mn atoms in paramagnetic CuMn alloys induced by a Co layer
  
  Abes, M., Atkinson, D., Tanner, B., Charlton, T., Langridge, S., Hase, T., Ali, M., Marrows, C., Neudert, A., Hicken, R., Mirone, A., & Arena, D. (2009). The spin polarization of Mn atoms in paramagnetic CuMn alloys induced by a Co layer. Journal of Applied Physics, 105(7), Article 07C703. https://doi.org/10.1063/1.3063065
• Thick epitaxial CdTe films grown by close space sublimation on Ge substrates.
  
  Jiang, Q., Halliday, D., Tanner, B., Brinkman, A., Cantwell, B., Mullins, J., & Basu, A. (2009). Thick epitaxial CdTe films grown by close space sublimation on Ge substrates. Journal of Physics D: Applied Physics, 42(1), Article 012004. https://doi.org/10.1088/0022-3727/42/1/012004
• The Role of Preoxidation on the Interface Structure of Co/MgO Multilayers
  
  Eastwood, D., Egelhoff, W., & Tanner, B. (2008). The Role of Preoxidation on the Interface Structure of Co/MgO Multilayers. IEEE Transactions on Magnetics, 44(11), 3594-3596.
• Vapor-phase growth of bulk crystals of cadmium telluride and cadmium zinc telluride on gallium arsenide seeds
  
  Mullins, J., Cantwell, B., Basu, A., Jiang, Q., Choubey, A., Brinkman, A., & Tanner, B. (2008). Vapor-phase growth of bulk crystals of cadmium telluride and cadmium zinc telluride on gallium arsenide seeds. Journal of Electronic Materials, 37(9), 1460-1464.
• Artificial ferrimagnetic structure and thermal hysteresis in Gd0.47Co0.53/Co multilayers
  
  Andres, J., Gonzalez, J., Hase, T., Tanner, B., & Riveiro, J. (2008). Artificial ferrimagnetic structure and thermal hysteresis in Gd0.47Co0.53/Co multilayers. Physical Review B, 77(14).
• Ferromagnetic resonance linewidth reduction in Fe/Au multilayers using ion beams
  
  Bilzer, C., Devolder, T., Chappert, C., Plantevin, O., Suszka, A., Hickey, B., Lamperti, A., Tanner, B., Mahrov, B., & Demokritov, S. (2008). Ferromagnetic resonance linewidth reduction in Fe/Au multilayers using ion beams. Journal of Applied Physics, 103(7), Article 07B518. https://doi.org/10.1063/1.2839266
• Layer and interface structure of CoFe/Ru multilayers
  
  Pym, A., Lamperti, A., Cardoso, S., Freitas, P., & Tanner, B. (2007). Layer and interface structure of CoFe/Ru multilayers. Acta Physica Polonica. A, 112(6), 1243-1248.
• Element specific separation of bulk and interfacial magnetic hysteresis loops
  
  Suszka, A., Kinane, C., Marrows, C., Hickey, B., Arena, D., Dvorak, J., Lamperti, A., Tanner, B., & Langridge, S. (2007). Element specific separation of bulk and interfacial magnetic hysteresis loops. Applied Physics Letters, 91(13).
• Interface stability of magnetic tunnel barriers and electrodes
  
  Lamperti, A., Pym, A., Eastwood, D., Cardoso, S., Wisniowski, P., Freitas, P., Anderson, G., Marrows, C., & Tanner, B. (2007). Interface stability of magnetic tunnel barriers and electrodes. Physica Status Solidi (a), 204(8), 2778-2784.
• Grazing incidence X-ray scattering from epitaxial Fe/Au multilayers
  
  Rozatian, A., Hase, T., Tanner, B., Ryan, P., Dekadjevi, D., & Hickey, B. (2007). Grazing incidence X-ray scattering from epitaxial Fe/Au multilayers. Physica Status Solidi (a), 204(8), 2626-2632.
• Optical excitation of a coherent transverse optical phonon in a polycrystalline Zr metal film
  
  Kruglyak, V., Hicken, R., Srivastava, G., Ali, M., Hickey, B., Pym, A., & Tanner, B. (2007). Optical excitation of a coherent transverse optical phonon in a polycrystalline Zr metal film. Physical Review B, 76(1).
• Interface dependent magnetic moments in Cu/Co,Ni/Cu/Si(001) epitaxial structures
  
  Vaz, C., Lauhoff, G., Bland, J., Langridge, S., Bucknall, D., Penfold, J., Clarke, J., Halder, S., & Tanner, B. (2007). Interface dependent magnetic moments in Cu/Co,Ni/Cu/Si(001) epitaxial structures. Journal of Magnetism and Magnetic Materials, 313(1), 89-97.
• X-ray scattering from two-dimensionally patterned magnetic thin film nanoscale arrays
  
  Hase, T., van Kampen, M., Bručas, R., Hjörvarsson, B., Atkinson, D., & Tanner, B. (2007). X-ray scattering from two-dimensionally patterned magnetic thin film nanoscale arrays. Superlattices and Microstructures, 41, 163-167.
• Interface stability in CoFe and CoFeB based multilayers
  
  Pym, A., Lamperti, A., Cardoso, S., Freitas, P., & Tanner, B. (2007). Interface stability in CoFe and CoFeB based multilayers. Superlattices and Microstructures, 41, 122-126.
• Sub-surface damage in ground and annealed alumina and alumina-siliconcarbide nanocomposites
  
  Tanner, B., Wu, H., & Roberts, S. (2006). Sub-surface damage in ground and annealed alumina and alumina-siliconcarbide nanocomposites. Journal of the American Ceramic Society, 89(12), 3745-3750.
• Synthesis of size controlled fcc and fct FePt nanoparticles
  
  Nguyen, H., Howard, L., Stinton, G., Giblin, S., Tanner, B., Terry, I., Hughes, A., Ross, I., Serres, A., & Evans, J. (2006). Synthesis of size controlled fcc and fct FePt nanoparticles. Chemistry of Materials, 18(26), 6414-6418. https://doi.org/10.1021/cm062127e
• Interface sharpening in CoFeB magnetic tunnel junctions
  
  Pym, A., Lamperti, A., Tanner, B., Dimopoulos, T., Ruhrig, M., & Wecker, J. (2006). Interface sharpening in CoFeB magnetic tunnel junctions. Applied Physics Letters, 88(16). https://doi.org/10.1063/1.2195774
• High-Resolution Parallel-Beam Powder Diffraction Measurement of Sub-Surface Damage in Alumina-silicon carbide nanocomposite
  
  Tanner, B., Wu, H., & Roberts, S. (2006). High-Resolution Parallel-Beam Powder Diffraction Measurement of Sub-Surface Damage in Alumina-silicon carbide nanocomposite. Advances in X-Ray Analysis., 49, 169-174.
• Factors affecting in-line phase-contrast imaging with a laboratory micro-focus x-ray source
  
  Kelly, K., & Tanner, B. (2006). Factors affecting in-line phase-contrast imaging with a laboratory micro-focus x-ray source. Advances in X-Ray Analysis., 49, 31-36.
• A synthetic route to size-controlled fcc and fct FePt nanoparticles
  
  Howard, L., Nguyen, H., Giblin, S., Tanner, B., Terry, I., Hughes, A., & Evans, J. (2005). A synthetic route to size-controlled fcc and fct FePt nanoparticles. Journal of the American Chemical Society, 127(29), 10140-10141. https://doi.org/10.1021/ja051669e
• Direct evidence for compressive elastic strain at ground surfaces of nanocomposite ceramics
  
  Tanner, B., Wu, H., & Roberts, S. (2005). Direct evidence for compressive elastic strain at ground surfaces of nanocomposite ceramics. Applied Physics Letters, 86(6). https://doi.org/10.1063/1.1862754
• The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers
  
  Pym, A., Rozatian, A., Marrows, C., Brown, S., Bouchenoire, L., Hase, T., & Tanner, B. (2005). The in-plane length scale of the conformal interface roughness as a function of bilayer repeat number in Co/Pd multilayers. Journal of Physics D Applied Physics, 38, A190-A194.
• Ultrafast third-order optical nonlinearity of noble and transition metal thin films
  
  Kruglyak, V., Hicken, R., Ali, M., Hickey, B., Pym, A., & Tanner, B. (2005). Ultrafast third-order optical nonlinearity of noble and transition metal thin films. Journal of Optics A: Pure and Applied Optics, 7, 235-.
• Structural phase transition of Fe grown on Au(111)
  
  Dekadjevi, D., Hickey, B., Brown, S., Hase, T., Fulthorpe, B., & Tanner, B. (2005). Structural phase transition of Fe grown on Au(111). Physical Review B, 71, 054108-.
• Synthesis of monodispersed fcc and fct FePt/FePd nanoparticles bymicrowave irradiation
  
  Nguyen, H., Howard, L., Giblin, S., Tanner, B., Terry, I., Hughes, A., Ross, I., Serres, A., Burckstummer, H., & Evans, J. (2005). Synthesis of monodispersed fcc and fct FePt/FePd nanoparticles bymicrowave irradiation. Journal of Materials Chemistry, 15(48), 5136-5143.
• The relationship between interface structure, conformality and perpendicular anisotropy in CoPd multilayers
  
  Rozatian, A., Marrows, C., Hase, T., & Tanner, B. (2005). The relationship between interface structure, conformality and perpendicular anisotropy in CoPd multilayers. Journal of Physics: Condensed Matter, 17, 3759-3770.
• The out-of-plane correlation length of the conformal roughness in Co-Pd multilayers
  
  Pym, A., Rozatian, A., Marrows, C., Hickey, B., Hase, T., & Tanner, B. (2005). The out-of-plane correlation length of the conformal roughness in Co-Pd multilayers. Physica B Condensed Matter, 357, 170-174.
• Measurement of hot electron momentum relaxation times in metals by femtosecond ellipsometry
  
  Kruglyak, V., Hicken, R., Ali, M., Hickey, B., Pym, A., & Tanner, B. (2005). Measurement of hot electron momentum relaxation times in metals by femtosecond ellipsometry. Physical Review B, 71, 233104-.
• Influence of the interfacial roughness on electron channelling in Fe/Au(001) multilayers
  
  Cole, A., Hickey, B., Hase, T., Buchanan, J., & Tanner, B. (2004). Influence of the interfacial roughness on electron channelling in Fe/Au(001) multilayers. Journal of Physics: Condensed Matter, 16, 1197-1209.
• Grazing Incidence In-plane X-ray Diffraction In The Laboratory
  
  Tanner, B., Hase, T., Lafford, T., & Goorsky, M. (2004). Grazing Incidence In-plane X-ray Diffraction In The Laboratory. Powder Diffraction, 19, 45-48.
• Grazing incidence X-ray scattering from Ge/Si superlattices grown at low temperature
  
  Wu, X., Hase, T., Tanner, B., & Cheng, H. (2004). Grazing incidence X-ray scattering from Ge/Si superlattices grown at low temperature. Surface Science, 548, 239-245.
• Interface intermixing and in-plane grain size in aluminum transition-metal bilayers
  
  Buchanan, J., Hase, T., Tanner, B., Powell, C., & Egelhoff, W. J. (2004). Interface intermixing and in-plane grain size in aluminum transition-metal bilayers. Journal of Applied Physics, 96, 7278-7282.
• Subsurface Damage In Alumina And Alumina-silicon Carbide Nanocomposites
  
  Tanner, B., Wu, H., Roberts, S., & Hase, T. (2004). Subsurface Damage In Alumina And Alumina-silicon Carbide Nanocomposites. Philosophical Magazine, 84, 1219-1232.
• Investigation of ultrafast demagnetization and cubic optical nonlinearity of Ni in the polar geometry
  
  Wilks, R., Hicken, R., Ali, M., Hickey, B., Buchanan, J., Pym, A., & Tanner, B. (2004). Investigation of ultrafast demagnetization and cubic optical nonlinearity of Ni in the polar geometry. Journal of Applied Physics, 95, 7441-7443.
• Substrate and thickness effects on structure and transport properties of La_2/3Ca_1/3MnO₃ films
  
  Wu, X., Cai, H., Xu, J., Tan, W., Hu, A., Jiang, S., Hase, T., Tanner, B., & Xiong, G. (2004). Substrate and thickness effects on structure and transport properties of La<SUB>2/3</SUB>Ca<SUB>1/3</SUB>MnO₃ films. Journal of Applied Physics, 95, 7109-7111.
• Influence of alloy composition and interlayer thickness on twist and tilt mosaic in Al_xGa_1-xN/AlN/GaN heterostructures
  
  Lafford, T., Parbrook, P., & Tanner, B. (2003). Influence of alloy composition and interlayer thickness on twist and tilt mosaic in Al<SUB>x</SUB>Ga<SUB>1-x</SUB>N/AlN/GaN heterostructures. Applied Physics Letters, 83(26), 5434-5436. https://doi.org/10.1063/1.1637717
• Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers
  
  Hase, T., Buchanan, J., Tanner, B., Langridge, S., Dalgliesh, R., Foster, S., Marrows, C., & Hickey, B. (2003). Resonant magnetic x-ray and neutron diffuse studies of transition metal multilayers. Journal of Applied Physics, 93(10), 6510-6512. https://doi.org/10.1063/1.1543876
• Intermixing of aluminum-magnetic transition-metal bilayers
  
  Buchanan, J., Hase, T., Tanner, B., Chen, P., Gan, L., Powell, C., & Egelhoff, W. (2003). Intermixing of aluminum-magnetic transition-metal bilayers. Journal of Applied Physics, 93, 8044-8046.
• Structural and chemical diagnosis of magnetic multilayers by RAFS and XRF techniques
  
  Mai, Z., Luo, G., Liu, C., Li, M., Jiang, H., Lai, W., Wang, J., Ding, Y., Hase, T., Fulthorpe, B., Tanner, ., & K., B. (2003). Structural and chemical diagnosis of magnetic multilayers by RAFS and XRF techniques. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions With Materials and, 199, 494-498.
• Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy
  
  Hase, T., Ho, E., Freijo, J.-J., Thompson, S., Petford-Long, A., & Tanner, B. (2003). Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy. Journal of Physics D Applied Physics, 36, A231-A235.
• X-ray study of the interdiffusion and interfacial structure in ferrimagnetic Gd_1-xCo_x/Co multilayers
  
  González, J., Andrés, J., López de La Torre, M., Riveiro, J., Hase, T., & Tanner, B. (2003). X-ray study of the interdiffusion and interfacial structure in ferrimagnetic Gd<SUB>1-x</SUB>Co<SUB>x</SUB>/Co multilayers. Journal of Applied Physics, 93, 7247-7249.
• Direct measurement of twist mosaic in epitaxial GaN.
  
  Lafford, T., Ryan, P., Joyce, D., Goorsky, M., & Tanner, B. (2003). Direct measurement of twist mosaic in epitaxial GaN. Physica Status Solidi (a), 195(1), 265-270. https://doi.org/10.1002/pssa.200306270
• Anisotropy and interface structure in sputtered Co/Pt multilayers on Si
  
  Rozatian, A., Fulthorpe, B., Hase, T., Read, D., Ashcroft, G., Joyce, D., Grundy, P., Amighian, J., & Tanner, B. (2003). Anisotropy and interface structure in sputtered Co/Pt multilayers on Si. Journal of Magnetism and Magnetic Materials, 256, 365-372.
• Direct measurement of twist mosaic in GaN epitaxial films as a function of growth temperature
  
  Lafford, T., Tanner, B., & Parbrook, P. (2003). Direct measurement of twist mosaic in GaN epitaxial films as a function of growth temperature. Journal of Physics D Applied Physics, 36, A245-A248.
• Observation of hardening during relaxation of InGaAs on GaAs
  
  Tanner, B., Parbrook, P., Lunn, B., Hogg, J., Keir, A., & Johnson, A. (2003). Observation of hardening during relaxation of InGaAs on GaAs. Journal of Physics D Applied Physics, 36, A198-A201.
• X-ray scattering from uniform and patterned indium tin oxide thin films
  
  Clarke, J., Pape, I., Normile, P., & Tanner, B. (2003). X-ray scattering from uniform and patterned indium tin oxide thin films. Journal of Physics D Applied Physics, 36, A209-A213.
• Spin-valve magnetization reversal obtained by N-doping in Fe/insulator/Fe trilayers
  
  Georgieva, M., Telling, N., Jones, G., Grundy, P., Hase, T., & Tanner, B. (2003). Spin-valve magnetization reversal obtained by N-doping in Fe/insulator/Fe trilayers. Journal of Physics: Condensed Matter, 15, 617-624.
• Determination of the thickness of Al₂O₃ barriers in magnetic tunnel junctions
  
  Buchanan, J., Hase, T., Tanner, B., Hughes, N., & Hicken, R. (2002). Determination of the thickness of Al₂O₃ barriers in magnetic tunnel junctions. Applied Physics Letters, 81(4), 751-753. https://doi.org/10.1063/1.1496131
• Novel diffractometer optimized for the study of weak superlattice reflections using crossed parabolic mirrors
  
  Wilkins, S., Spencer, P., Hatton, P., Tanner, B., Lafford, T., Spence, J., & Loxley, N. (2002). Novel diffractometer optimized for the study of weak superlattice reflections using crossed parabolic mirrors. Review of Scientific Instruments, 73(7), 2666-2671. https://doi.org/10.1063/1.1484240
• Anomalously large intermixing in aluminum-transition-metal bilayers
  
  Buchanan, J., Hase, T., Tanner, B., Chen, P., Gan, L., Powell, C., & Egelhoff, W. (2002). Anomalously large intermixing in aluminum-transition-metal bilayers. Physical Review B, 66, 104427-.
• Grazing Incidence In-plane Diffraction Measurement Of In-plane Mosaic With Microfocus X-ray Tubes
  
  Goorsky, M., & Tanner, B. (2002). Grazing Incidence In-plane Diffraction Measurement Of In-plane Mosaic With Microfocus X-ray Tubes. Crystal Research and Technology, 37, 645-653.
• Bonding and mechanical properties of ultrathin diamond-like carbon films
  
  Beghi, M., Ferrari, A., Teo, K., Robertson, J., Bottani, C., Libassi, A., & Tanner, B. (2002). Bonding and mechanical properties of ultrathin diamond-like carbon films. Applied Physics Letters, 81, 3804-3806.
• Elastic Constants And Structural Properties Of Nanometre-thick Diamond-like Carbon Films
  
  Beghi, M., Ferrari, A., Bottani, C., Libassi, A., Tanner, B., Teo, K., & Robertson, J. (2002). Elastic Constants And Structural Properties Of Nanometre-thick Diamond-like Carbon Films. Diamond and Related Materials, 11, 1062-1067.
• Measurement Of The Elastic Constants Of Nanometer-thick Films
  
  Beghi, M., Bottani, C., Bassi, A., Ossi, P., Tanner, B., Ferrari, A., & Robertson, J. (2002). Measurement Of The Elastic Constants Of Nanometer-thick Films. Materials Science and Engineering: C, 19, 201-204.
• Weak magnetic moment on IrMn exchange bias pinning layers
  
  Hase, T., Fulthorpe, B., Wilkins, S., Tanner, B., Marrows, C., & Hickey, B. (2001). Weak magnetic moment on IrMn exchange bias pinning layers. Applied Physics Letters, 79(7), 985-987. https://doi.org/10.1063/1.1392304
• Experimental evidence for electron channeling in Fe /Au (100) superlattices
  
  Dekadjevi, D., Ryan, P., Fulthorpe, B., Hickey, B., & Tanner, B. (2001). Experimental evidence for electron channeling in Fe /Au (100) superlattices. Physical Review Letters, 86(25), 5787-5790. https://doi.org/10.1103/physrevlett.86.5787
• Determination Of The Depth Distribution Of Subsurface Damage During Polishing Of Alumina
  
  Tanner, B., Hase, T., & Wu, H. (2001). Determination Of The Depth Distribution Of Subsurface Damage During Polishing Of Alumina. Philosophical Magazine Letters, 81, 351-355.
• Structural and magnetic changes on annealing permalloy/copper multilayers
  
  Fulthorpe, B., Hase, T., Tanner, B., Marrows, C., & Hickey, B. (2001). Structural and magnetic changes on annealing permalloy/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1733-1734.
• X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers
  
  Luo, G., Mai, Z., Hase, T., Fulthorpe, B., Tanner, B., Marrows, C., & Hickey, B. (2001). X-ray reflection anomalous fine structure analysis of the stability of permalloy/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1728-1729.
• Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers
  
  Luo, G., Mai, Z., Hase, T., Fulthorpe, B., Tanner, B., Marrows, C., & Hickey, B. (2001). Variable wavelength grazing incidence x-ray reflectivity measurements of structural changes on annealing Cu/NiFe multilayers. Physical Review B, 64, 245404-.
• Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films
  
  Vaz, C., Lauhoff, G., Bland, J., Fulthorpe, B., Hase, T., Tanner, B., Langridge, S., & Penfold, J. (2001). Effect of the Cu capping thickness on the magnetic properties of thin Ni/Cu(001) films. Journal of Magnetism and Magnetic Materials, 226, 1618-1620.
• In situ x-ray topography measurement of the growth temperature dependence of the critical thickness of epitaxial InGaAs on GaAs
  
  Tanner, B., Parbrook, P., Whitehouse, C., Keir, A., Johnson, A., Jones, J., Wallis, D., Smith, L., Lunn, B., & Hogg, J. (2001). In situ x-ray topography measurement of the growth temperature dependence of the critical thickness of epitaxial InGaAs on GaAs. Journal of Physics D Applied Physics, 34, A109-A113.
• Brillouin Scattering Investigation Of Melting In Sn Nanoparticles
  
  Bottani, C., Bassi, A., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (2001). Brillouin Scattering Investigation Of Melting In Sn Nanoparticles. Materials Science and Engineering: C, 15, 41-43.
• High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers
  
  Fulthorpe, B., Ryan, P., Hase, T., Tanner, B., & Hickey, B. (2001). High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers. Journal of Physics D Applied Physics, 34, A203-A207.
• Kinetics Of Native Oxide Film Growth On Epiready Gaas
  
  Tanner, B., Allwood, D., & Mason, N. (2001). Kinetics Of Native Oxide Film Growth On Epiready Gaas. Materials Science and Engineering: B, 80, 99-103.
• Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers
  
  Hase, T., Fulthorpe, B., Wilkins, S., Tanner, B., Marrows, C., & Hickey, B. (2001). Soft X-ray magnetic scattering study of rotational magnetisation processes in cobalt/copper multilayers. Journal of Magnetism and Magnetic Materials, 226, 1717-1719.
• Measurement Of The Elastic Constants Of Nanometric Films
  
  Beghi, M., Bottani, C., Bassi, A., Tanner, B., Ferrari, A., Teo, K., & Robertson, J. (2001). Measurement Of The Elastic Constants Of Nanometric Films. Proceedings of SPIE - International Society for Optical Engineering, 4449, 119-130.
• The effect of plastic deformation and residual stress on the permeability and magnetostriction of steels
  
  Makar, J., & Tanner, B. (2000). The effect of plastic deformation and residual stress on the permeability and magnetostriction of steels. Journal of Magnetism and Magnetic Materials, 222, 291-304.
• Dependence of the critical thickness on Si doping of InGaAs on GaAs
  
  Tanner, B., Parbrook, P., Whitehouse, C., Keir, A., Johnson, A., Jones, J., Wallis, D., Smith, L., Lunn, B., & Hogg, J. (2000). Dependence of the critical thickness on Si doping of InGaAs on GaAs. Applied Physics Letters, 77, 2156-2158.
• Density And Sp(3) Content In Diamond-like Carbon Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy
  
  Libassi, A., Ferrari, A., Stolojan, V., Tanner, B., Robertson, J., & Brown, L. (2000). Density And Sp(3) Content In Diamond-like Carbon Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy. Amorphous And Nanostructured Carbon, 593, 293-298.
• Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers
  
  Hase, T., Pape, I., Tanner, B., Dürr, H., Dudzik, E., van der Laan, G., Marrows, C., & Hickey, B. (2000). Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers. Physical Review B, 61, 3792-.
• Damage caused to interlayer coupling of magnetic multilayers by residual gases
  
  Marrows, C., Hickey, B., Herrmann, M., McVitie, S., Chapman, J., Ormston, M., Petford-Long, A., Hase, T., & Tanner, B. (2000). Damage caused to interlayer coupling of magnetic multilayers by residual gases. Physical Review B, 61, 4131-4140.
• Soft x-ray magnetic scattering evidence for biquadratic coupling in Co/Cu multilayers
  
  Hase, T., Pape, I., Read, D., Tanner, B., Dürr, H., Dudzik, E., van der Laan, G., Marrows, C., & Hickey, B. (2000). Soft x-ray magnetic scattering evidence for biquadratic coupling in Co/Cu multilayers. Physical Review B, 61, 15331-15337.
• Density, Sp(3) Content And Internal Layering Of Dlc Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy
  
  Libassi, A., Ferrari, A., Stolojan, V., Tanner, B., Robertson, J., & Brown, L. (2000). Density, Sp(3) Content And Internal Layering Of Dlc Films By X-ray Reflectivity And Electron Energy Loss Spectroscopy. Diamond and Related Materials, 9, 771-776.
• X-ray scattering studies of 2H-NbSe₂, a superconductor and charge density wave material, under high external magnetic fields
  
  Du, C.-H., Lin, W., Su, Y., Tanner, B., Hatton, P., Casa, D., Keimer, B., Hill, J., Oglesby, C., & Hohl, H. (2000). X-ray scattering studies of 2H-NbSe₂, a superconductor and charge density wave material, under high external magnetic fields. Journal of Physics: Condensed Matter, 12, 5361-5370.
• Density, sp³ fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy
  
  Ferrari, A., Libassi, A., Tanner, B., Stolojan, V., Yuan, J., Brown, L., Rodil, S., Kleinsorge, B., & Robertson, J. (2000). Density, sp³ fraction, and cross-sectional structure of amorphous carbon films determined by x-ray reflectivity and electron energy-loss spectroscopy. Physical Review B, 62, 11089-11103.
• The origin of the redshift in Brillouin spectra of silica films containing tin nanoparticles
  
  Li Bassi, A., Bottani, C., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (2000). The origin of the redshift in Brillouin spectra of silica films containing tin nanoparticles. European Physical Journal C: Particles and Fields, 18, 31-38.
• Evaluation Of Polishing Damage In Alumina
  
  Pape, I., Lawrence, C., Warren, P., Roberts, S., Briggs, G., Kolosov, O., Hey, A., Paines, C., & Tanner, B. (2000). Evaluation Of Polishing Damage In Alumina. Philosophical Magazine A-Physics Of Condensed Matter Structure Defects And Mechanical Properties, 80, 1913-1934. https://doi.org/10.1080/01418610008219094
• Determination Of Bonding In Amorphous Carbons By Electron Energy Loss Spectroscopy, Raman Scattering And X-ray Reflectivity
  
  Ferrari, A., Kleinsorge, B., Adamopoulos, G., Robertson, J., Milne, W., Stolojan, V., Brown, L., Libassi, A., & Tanner, B. (2000). Determination Of Bonding In Amorphous Carbons By Electron Energy Loss Spectroscopy, Raman Scattering And X-ray Reflectivity. Journal of Non-Crystalline Solids, 266, 765-768.
• Characterization Of Oxide Layers On Gaas Substrates
  
  Allwood, D., Carline, R., Mason, N., Pickering, C., Tanner, B., & Walker, P. (2000). Characterization Of Oxide Layers On Gaas Substrates. Thin Solid Films, 364, 33-39.
• Strain Relaxation In Ingaas Epilayers On Gaas By Means Of Twin Formation
  
  Moeck, P., Mizuno, K., Tanner, B., Lacey, G., Whitehouse, C., Smith, G., & Keir, A. (1999). Strain Relaxation In Ingaas Epilayers On Gaas By Means Of Twin Formation. Japanese Journal of Applied Physics, 38, 3628-3631.
• The progression of interface structure through sputtered Co/Cu and Co/Pt multilayer films
  
  Fulthorpe, B., Joyce, D., Hase, T., Rozatian, A., Tanner, B., & Grundy, P. (1999). The progression of interface structure through sputtered Co/Cu and Co/Pt multilayer films. Journal of Physics: Condensed Matter, 11, 8477-8487.
• Giant magnetoresistance and oscillatory exchange coupling in disordered Co/Cu multilayers
  
  Marrows, C., Wiser, N., Hickey, B., Hase, T., & Tanner, B. (1999). Giant magnetoresistance and oscillatory exchange coupling in disordered Co/Cu multilayers. Journal of Physics: Condensed Matter, 11, 81-88.
• Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation
  
  Mizuno, K., Mock, P., Tanner, B., Lacey, G., Whitehouse, C., Smith, G., & Keir, A. (1999). Partial Strain Relaxation In (in,ga)as Epilayers On Gaas By Means Of Twin Formation. Journal of Crystal Growth, 199, 1146-1150.
• X-ray Characterisation Of Indium Phosphide Substrates
  
  Moore, C., & Tanner, B. (1999). X-ray Characterisation Of Indium Phosphide Substrates. Materials Science and Engineering: B, 66, 11-14.
• X-ray optics of in situ synchrotron topography of InGaAs on GaAs
  
  Tanner, B., Keir, A., Möck, P., Whitehouse, C., Lacey, G., Johnson, A., Smith, G., & Clark, G. (1999). X-ray optics of in situ synchrotron topography of InGaAs on GaAs. Journal of Physics D Applied Physics, 32, A119-A122.
• High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy
  
  Moore, C., & Tanner, B. (1999). High-resolution X-ray diffraction determination of composition grading in Hg1-xMnxTe grown by interdiffused multilayer organometallic vapour-phase epitaxy. "Philosophical Transactions A: Mathematical, Physical and Engineering Sciences", 357, 2801-.
• Grazing Incidence X-ray Scattering Measurement Of Silicate Glass Surfaces
  
  Pape, I., Tanner, B., & Wormington, M. (1999). Grazing Incidence X-ray Scattering Measurement Of Silicate Glass Surfaces. Journal of Non-Crystalline Solids, 248, 75-83.
• Influence of step-bunching on grazing incidence diffuse x-ray scattering
  
  Clarke, J., Pape, I., Tanner, B., & Wormington, M. (1999). Influence of step-bunching on grazing incidence diffuse x-ray scattering. Journal of Physics: Condensed Matter, 11, 2661-2668.
• Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity
  
  Stolojan, V., Brown, L., Ferrari, A., Robertson, J., Bassi, A., & Tanner, B. (1999). Comparative Study Of Properties Of Dlc Films By Electron Energy Loss Spectroscopy And X-ray Reflectivity. Institute of Physics Conference Series., 161, 361-364.
• Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction
  
  Bottani, C., Li Bassi, A., Tanner, B., Stella, A., Tognini, P., Cheyssac, P., & Kofman, R. (1999). Melting in metallic Sn nanoparticles studied by surface Brillouin scattering and synchrotron-x-ray diffraction. Physical Review B, 59, 15601-.
• Guest Editor's introduction
  
  Tanner, B. (1999). Guest Editor’s introduction. Journal of Physics D Applied Physics, 32, A1-A2.
• The effect of conformal roughness on spin-valves
  
  Clarke, J., Marrows, C., Stanley, F., Bunyan, R., Tanner, B., & Hickey, B. (1999). The effect of conformal roughness on spin-valves. Journal of Physics D Applied Physics, 32, 1169-1174.
• Preface to X-ray topography and cystal characterization. A Theme issue published by The Royal Society.
  
  Bowen, D., & Tanner, B. (1999). Preface to X-ray topography and cystal characterization. A Theme issue published by The Royal Society. "Philosophical Transactions A: Mathematical, Physical and Engineering Sciences", 357, 2629-.
• Characterisation Of Cadmium Telluride Bulk Crystals Grown By A Novel "multi-tube" Vapour Growth Technique
  
  Aitken, N., Potter, M., Buckley, D., Mullins, J., Carles, J., Halliday, D., Durose, K., Tanner, B., & Brinkman, A. (1999). Characterisation Of Cadmium Telluride Bulk Crystals Grown By A Novel "multi-tube" Vapour Growth Technique. Journal of Crystal Growth, 199, 984-987. https://doi.org/10.1016/s0022-0248%2898%2901138-5
• The in situ measurement of the effect of plastic deformation on the magnetic properties of steel Part II - Permeability curves
  
  Makar, J., & Tanner, B. (1998). The in situ measurement of the effect of plastic deformation on the magnetic properties of steel Part II - Permeability curves. Journal of Magnetism and Magnetic Materials, 187, 353-365.
• The relation of structure to giant magnetoresistance in Co/Cu multilayers
  
  Tanner, B., Hase, T., Pape, I., Laidler, H., Ryan, P., & Hickey, B. (1998). The relation of structure to giant magnetoresistance in Co/Cu multilayers. Journal of Magnetism and Magnetic Materials, 177, 1164-1165.
• The in situ measurement of the effect of plastic deformation on the magnetic properties of steel Part I - Hysteresis loops and magnetostriction
  
  Makar, J., & Tanner, B. (1998). The in situ measurement of the effect of plastic deformation on the magnetic properties of steel Part I - Hysteresis loops and magnetostriction. Journal of Magnetism and Magnetic Materials, 184, 193-208.
• In-situ Direct Measurement Of Activation Energies For The Generation Of Misfit Dislocations In The Ingaas/gaas (001) System
  
  Lacey, G., Whitehouse, C., Parbrook, P., Cullis, A., Keir, A., Mock, P., Johnson, A., Smith, G., Clark, G., Tanner, B., Martin, T., Lunn, B., Hogg, J., Emeny, M., Murphy, B., & Bennett, S. (1998). In-situ Direct Measurement Of Activation Energies For The Generation Of Misfit Dislocations In The Ingaas/gaas (001) System. Applied Surface Science, 123, 718-724.
• Analysis of grazing incidence X-ray diffuse scatter from Co-Cu multilayers
  
  Pape, I., Hase, T., Tanner, B., & Wormington, M. (1998). Analysis of grazing incidence X-ray diffuse scatter from Co-Cu multilayers. Physica B Condensed Matter, 253, 278-289.
• X-ray Optics Of In-situ Synchrotron Topography Studies Of The Early Stages Of Relaxation In Epitaxial Ingaas On Gaas
  
  Tanner, B., Keir, A., Mock, P., Whitehouse, C., Lacey, G., Johnson, A., Smith, G., & Clark, G. (1998). X-ray Optics Of In-situ Synchrotron Topography Studies Of The Early Stages Of Relaxation In Epitaxial Ingaas On Gaas. Proceedings of SPIE - International Society for Optical Engineering, 3448, 100-107.
• Analysis Of Surface And Interface Modifications Of Thin Multilayered Films
  
  Beghi, M., Bottani, C., Ossi, P., Pastorelli, R., Poli, M., Tanner, B., & Liu, B. (1998). Analysis Of Surface And Interface Modifications Of Thin Multilayered Films. Surface and Coatings Technology, 101, 324-328.
• The effect of an interfacial layer on the relaxation of CdMnTe/CdTe multiple quantum well structures on InSb substrates
  
  Li, C., Tanner, B., Ashenford, D., Hogg, J., & Lunn, B. (1998). The effect of an interfacial layer on the relaxation of CdMnTe/CdTe multiple quantum well structures on InSb substrates. Semiconductor Science and Technology, 13, 746-749.
• Deposition And Characterisation Of Langmuir-blodgett Films Of An Azo-modified Polypeptide : Azobenzene-containing Poly-l-lysine
  
  Tedeschi, C., Fontana, M., Pieroni, O., Dei, L., Wilde, J., Pearson, C., Petty, M., & Tanner, B. (1998). Deposition And Characterisation Of Langmuir-blodgett Films Of An Azo-modified Polypeptide : Azobenzene-containing Poly-l-lysine. Thin Solid Films, 335, 197-202.
• The Effect Of Stresses Approaching And Exceeding The Yield Point On The Magnetic Properties Of High Strength Pearlitic Steels
  
  Makar, J., & Tanner, B. (1998). The Effect Of Stresses Approaching And Exceeding The Yield Point On The Magnetic Properties Of High Strength Pearlitic Steels. NDT and E International: Independent Nondestructive Testing and Evaluation, 31, 117-127.
• Structure And Elastic Properties Of Thin Alloyed Gold Films
  
  Beghi, M., Bottani, C., Guzman, L., Lafford, T., Laidani, N., Ossi, P., & Tanner, B. (1998). Structure And Elastic Properties Of Thin Alloyed Gold Films. Thin Solid Films, 317, 198-201.
• Crystallographic texture and interface structure in Co/Cu multilayer films
  
  Joyce, D., Faunce, C., Grundy, P., Fulthorpe, B., Hase, T., Pape, I., & Tanner, B. (1998). Crystallographic texture and interface structure in Co/Cu multilayer films. Physical Review B, 58, 5594-5601.
• The electrical behaviour of multilayer polypyrrole films
  
  Casalini, R., Goldenberg, L., Pearson, C., Tanner, B., & Petty, M. (1998). The electrical behaviour of multilayer polypyrrole films. Journal of Physics D Applied Physics, 31, 1504-1510.
• Identification Of Misfit Dislocations Using X-ray Scattering And Topography
  
  Tanner, B., Mock, P., & Mizuno, K. (1998). Identification Of Misfit Dislocations Using X-ray Scattering And Topography. Institute of Physics Conference Series., 160, 177-186.
• Bridgman Solidification Of Gasb In Space
  
  Duffar, T., Serrano, M., Moore, C., Camassel, J., Contreras, S., Dusserre, P., Rivoallant, A., & Tanner, B. (1998). Bridgman Solidification Of Gasb In Space. Journal of Crystal Growth, 192, 63-72.
• High-resolution X-ray scattering from CdMnTe/CdTe multiple quantum well structures
  
  Li, C., Tanner, B., Möck, P., Hogg, J., Lunn, B., & Ashenford, D. (1997). High-resolution X-ray scattering from CdMnTe/CdTe multiple quantum well structures. Nuovo Cimento D Serie, 19, 447-.
• Modification Of Molecular Packing: Crystal Structures And Magnetic Properties Of Monomeric And Dimeric Difluorophenyl-1,2,3,5-dithiadiazolyl Radicals
  
  Banister, A., Batsanov, A., Dawe, O., Herbertson, P., Howard, J., Lynn, S., May, I., Smith, J., Rawson, J., Rogers, T., Tanner, B., Antorrena, G., & Palacio, F. (1997). Modification Of Molecular Packing: Crystal Structures And Magnetic Properties Of Monomeric And Dimeric Difluorophenyl-1,2,3,5-dithiadiazolyl Radicals. Dalton Transactions., 15, 2539-2541. https://doi.org/10.1039/A702881D
• Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films
  
  Beghi, M., Bottani, C., Ossi, P., Lafford, T., Tanner, ., & K., B. (1997). Combined surface Brillouin scattering and x-ray reflectivity characterization of thin metallic films. Journal of Applied Physics, 81, 672-678.
• Growth And Characterization Of Magnetic Metal Mn Film By Mocvd
  
  Sang, W., Durose, K., Brinkman, A., & Tanner, B. (1997). Growth And Characterization Of Magnetic Metal Mn Film By Mocvd. Materials Chemistry and Physics, 47, 75-77. https://doi.org/10.1016/s0254-0584%2897%2980031-4
• Structural And Electrical Studies On Nickel(dmit)(2) Complexes
  
  Bryce, M., Moore, A., Batsanov, A., Howard, J., Goldenberg, L., Pearson, C., Petty, M., & Tanner, B. (1997). Structural And Electrical Studies On Nickel(dmit)(2) Complexes. Synthetic Metals, 86, 1839-1840.
• Triple-axis X-ray diffraction study of polishing damage in III-V semiconductors
  
  Moore, C., Pape, I., & Tanner, B. (1997). Triple-axis X-ray diffraction study of polishing damage in III-V semiconductors. Nuovo Cimento D Serie, 19, 205-.
• High resolution x-ray diffraction and scattering measurement of the interfacial structure of ZnTe/GaSb epilayers
  
  Li, C., Tanner, B., Ashenford, D., Hogg, J., & Lunn, B. (1997). High resolution x-ray diffraction and scattering measurement of the interfacial structure of ZnTe/GaSb epilayers. Journal of Applied Physics, 82, 2281-2287.
• Effect of annealing on the roughness and GMR of Fe/Cr multilayers
  
  Hickey, B., Laidler, H., Hase, T., Tanner, B., Schad, R., & Bruynseraede, Y. (1996). Effect of annealing on the roughness and GMR of Fe/Cr multilayers. Journal of Magnetism and Magnetic Materials, 156, 332-334.
• ERRATUM: Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction
  
  Möck, P., Tanner, B., Li, C., Keir, A., Johnson, A., Lacey, G., Clark, G., Lunn, B., & Hogg, J. (1996). ERRATUM: Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction. Semiconductor Science and Technology, 11, 1363-.
• Simulation Of Decorated Dislocation Images In X-ray Section Topographs
  
  Holland, A., & Tanner, B. (1996). Simulation Of Decorated Dislocation Images In X-ray Section Topographs. Philosophical Magazine A-Physics Of Condensed Matter Structure Defects And Mechanical Properties, 73, 1451-1474.
• Giant magnetoresistance and interface structure of Cu/Co multilayers grown by MBE on Si (111) substrates with copper-silicide buffers
  
  Tanner, B., Pape, I., Hase, T., Laidler, H., Emmerson, C., Hickey, B., & Shen, T. (1996). Giant magnetoresistance and interface structure of Cu/Co multilayers grown by MBE on Si (111) substrates with copper-silicide buffers. Journal of Magnetism and Magnetic Materials, 156, 373-374.
• Vinylogous Tetrathiafulvalene (ttf) Pi-electron Donors And Derived Radical Cations: Esr Spectroscopic, Magnetic, And X-ray Structural Studies
  
  Bryce, M., Moore, A., Tanner, B., Whitehead, R., Clegg, W., Gerson, F., Lamprecht, A., & Pfenninger, S. (1996). Vinylogous Tetrathiafulvalene (ttf) Pi-electron Donors And Derived Radical Cations: Esr Spectroscopic, Magnetic, And X-ray Structural Studies. Chemistry of Materials, 8, 1182-1188.
• Spontaneous Magnetization In A Sulfur-nitrogen Radical At 36 K
  
  Banister, A., Bricklebank, N., Lavender, I., Rawson, J., Gregory, C., Tanner, B., Clegg, W., Elsegood, M., & Palacio, F. (1996). Spontaneous Magnetization In A Sulfur-nitrogen Radical At 36 K. Angewandte Chemie International Edition, 35, 2533-2535.
• X-ray and magnetoresistance measurements of annealed Co/Cu multilayers
  
  Hickey, B., Laidler, H., Pape, I., Gregory, C., & Tanner, B. (1996). X-ray and magnetoresistance measurements of annealed Co/Cu multilayers. Journal of Magnetism and Magnetic Materials, 154, 165-174.
• Evidence For Grading At Polished Surfaces From Grazing-incidence X-ray Scattering
  
  Wormington, M., Pape, I., Hase, T., Tanner, B., & Bowen, D. (1996). Evidence For Grading At Polished Surfaces From Grazing-incidence X-ray Scattering. Philosophical Magazine Letters, 74, 211-216.
• Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction
  
  Möck, P., Tanner, B., Li, C., Keir, A., Johnson, A., Lacey, G., Clark, G., Lunn, B., & Hogg, J. (1996). Determination of the critical thickness of misfit dislocation multiplication using in situ double-crystal x-ray diffraction. Semiconductor Science and Technology, 11, 1051-1055.
• A Method For The Accurate Comparison Of Lattice Parameters
  
  Bowen, D., & Tanner, B. (1995). A Method For The Accurate Comparison Of Lattice Parameters. Journal of Applied Crystallography, 28, 753-760.
• Simulation of X-ray section topograph images of oxygen precipitates in silicon
  
  Holland, A., & Tanner, B. (1995). Simulation of X-ray section topograph images of oxygen precipitates in silicon. Journal of Physics D Applied Physics, 28, A27-A32.
• The effect of capping layers on low-angle Bragg peaks from copper-cobalt multilayers
  
  Tanner, B., & Safa, M. (1995). The effect of capping layers on low-angle Bragg peaks from copper-cobalt multilayers. Journal of Magnetism and Magnetic Materials, 150, L290-L292.
• In situ X-ray topography studies during the molecular beam epitaxy growth of InGaAs on (001) GaAs: effects of substrate dislocation distribution on strain relaxation
  
  Barnett, S., Keir, A., Cullis, A., Johnson, A., Jefferson, J., Smith, G., Martin, T., Whitehouse, C., Lacey, G., Clark, G., Tanner, B., Spirkl, W., Lunn, B., Hogg, J., Ashu, P., Hagston, W., & Castelli, C. (1995). In situ X-ray topography studies during the molecular beam epitaxy growth of InGaAs on (001) GaAs: effects of substrate dislocation distribution on strain relaxation. Journal of Physics D Applied Physics, 28, A17-A22.
• A Novel Beam-conditioning Monochromator For High-resolution X-ray-diffraction
  
  Loxley, N., Tanner, B., & Bowen, D. (1995). A Novel Beam-conditioning Monochromator For High-resolution X-ray-diffraction. Journal of Applied Crystallography, 28, 314-317.
• In-situ X-ray-imaging Of Iii-v Strained-layer Relaxation Processes
  
  Whitehouse, C., Cullis, A., Barnett, S., Usher, B., Clark, G., Keir, A., Tanner, B., Lunn, B., Hogg, J., Johnson, A., Lacey, G., Spirkl, W., Hagston, W., Jefferson, J., Ashu, P., & Smith, G. (1995). In-situ X-ray-imaging Of Iii-v Strained-layer Relaxation Processes. Journal of Crystal Growth, 150, 85-91.
• Depth Resolved X-ray Studies Of Tilt Distributions In Cdte/gaas Epilayers
  
  Port, R., Moore, C., Tanner, B., Durose, K., & Hails, J. (1995). Depth Resolved X-ray Studies Of Tilt Distributions In Cdte/gaas Epilayers. Institute of Physics Conference Series., 146, 309-312.
• A Comparison Of Techniques For Nondestructive Composition Measurements In Cdznte Substrates
  
  Tobin, S., Tower, J., Norton, P., Chandlerhorowitz, D., Amirtharaj, P., Lopes, V., Duncan, W., Syllaios, A., Ard, C., Giles, N., Lee, J., Balasubramanian, R., Bollong, A., Steiner, T., Thewalt, M., Bowen, D., & Tanner, B. (1995). A Comparison Of Techniques For Nondestructive Composition Measurements In Cdznte Substrates. Journal of Electronic Materials, 24, 697-705.
• Uniformity In (hg, Mn)te Films Grown By Metalorganic Vapor-phase Epitaxy
  
  Hallam, T., Oktik, S., Funaki, M., Moore, C., Brinkman, A., Durose, K., & Tanner, B. (1995). Uniformity In (hg, Mn)te Films Grown By Metalorganic Vapor-phase Epitaxy. Journal of Crystal Growth, 146, 604-609. https://doi.org/10.1016/0022-0248%2894%2900577-x
• A novel high dynamic range X-ray detector for synchrotron radiation studies
  
  Cockerton, S., Tanner, B., & Derbyshire, G. (1995). A novel high dynamic range X-ray detector for synchrotron radiation studies. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions With Materials and, 97, 561-566.
• New Methods For The Accurate Comparison Of Lattice-parameters
  
  Bowen, D., & Tanner, B. (1994). New Methods For The Accurate Comparison Of Lattice-parameters. Advances in X-Ray Analysis., 37, 123-128.
• The magnetic properties of specially prepared pearlitic steels of varying carbon content as a function of plastic deformation
  
  Thompson, S., & Tanner, B. (1994). The magnetic properties of specially prepared pearlitic steels of varying carbon content as a function of plastic deformation. Journal of Magnetism and Magnetic Materials, 132, 71-88.
• Experimental Comparison Of Widely Differing Lattice-parameters
  
  Bowen, D., Tanner, B., Hudson, J., Pape, I., Loxley, N., & Tobin, S. (1994). Experimental Comparison Of Widely Differing Lattice-parameters. Advances in X-Ray Analysis., 37, 129-133.
• Dislocation Contrast In X-ray Reflection Topography Of Strained Heterostructures
  
  Spirkl, W., Tanner, B., Whitehouse, C., Barnett, S., Cullis, A., Johnson, A., Keir, A., Usher, B., Clark, G., Hagston, W., Hogg, C., & Lunn, B. (1994). Dislocation Contrast In X-ray Reflection Topography Of Strained Heterostructures. Philosophical Magazine A-Physics Of Condensed Matter Structure Defects And Mechanical Properties, 70, 531-548.
• High-speed Characterization Of Pseudomorphic Hemt Structures Using A Very-low Noise Scintillation Detector
  
  Loxley, N., Cockerton, S., & Tanner, B. (1994). High-speed Characterization Of Pseudomorphic Hemt Structures Using A Very-low Noise Scintillation Detector. Advances in X-Ray Analysis., 37, 145-151.
• Application Of Synchrotron X-ray Topography To The Study Of Materials
  
  Tanner, B. (1994). Application Of Synchrotron X-ray Topography To The Study Of Materials. Acta Physica Polonica. A, 86, 537-544.
• Simulation Of X-ray Reflection Topographs From Misfit Dislocations
  
  Spirkl, W., Tanner, B., Whitehouse, C., Barnett, S., Cullis, A., Johnson, A., Keir, A., Usher, B., Clark, G., Hagston, W., Hogg, C., & Lunn, B. (1994). Simulation Of X-ray Reflection Topographs From Misfit Dislocations. Philosophical Magazine A-Physics Of Condensed Matter Structure Defects And Mechanical Properties, 69, 221-236.
• Fourier Transformation Of X-ray Rocking Curves From Interferometer Structures
  
  Hudson, J., Tanner, B., & Blunt, R. (1994). Fourier Transformation Of X-ray Rocking Curves From Interferometer Structures. Advances in X-Ray Analysis., 37, 135-144.
• The magnetic properties of pearlitic steels as a function of carbon content
  
  Thompson, S., & Tanner, B. (1993). The magnetic properties of pearlitic steels as a function of carbon content. Journal of Magnetism and Magnetic Materials, 123, 283-298.
• Simulation of dislocation images in Bragg-case double-crystal topographs of misfit dislocations in relaxed epitaxial layers of III-V semiconductors
  
  Cottrell, S., Spirkl, W., & Tanner, B. (1993). Simulation of dislocation images in Bragg-case double-crystal topographs of misfit dislocations in relaxed epitaxial layers of III-V semiconductors. Journal of Physics D Applied Physics, 26, A126-A130.
• Characterization of engineering surfaces by grazing-incidence X-ray reflectivity
  
  Bowen, D., & Tanner, B. (1993). Characterization of engineering surfaces by grazing-incidence X-ray reflectivity. Nanotechnology, 4, 175-182.
• X-ray topography studies of the defect depth profile in processed silicon wafers
  
  Halfpenny, P., Green, G., & Tanner, B. (1993). X-ray topography studies of the defect depth profile in processed silicon wafers. Journal of Physics D Applied Physics, 26, A65-A68.
• Advanced X-ray-scattering Techniques For The Characterization Of Semiconducting Materials
  
  Tanner, B., & Bowen, D. (1993). Advanced X-ray-scattering Techniques For The Characterization Of Semiconducting Materials. Journal of Crystal Growth, 126, 1-18.
• X-ray scattering and topography studies of Hg_1-xMn_xTe epitaxial films
  
  Hallam, T., Halder, S., Hudson, J., Li, C., Funaki, M., Lewis, J., Brinkman, A., & Tanner, B. (1993). X-ray scattering and topography studies of Hg_1-xMn_xTe epitaxial films. Journal of Physics D Applied Physics, 26, 161-.
• Contrast of device structures in X-ray section topographs
  
  Holland, A., & Tanner, B. (1993). Contrast of device structures in X-ray section topographs. Journal of Physics D Applied Physics, 26, A137-A141.
• Epitaxial growth of (Hg,Mn)Te by the interdiffused multilayer process
  
  Funaki, M., Brinkman, A., Hallam, T., & Tanner, B. (1993). Epitaxial growth of (Hg,Mn)Te by the interdiffused multilayer process. Applied Physics Letters, 62, 2983-2985.
• X-ray scattering and topography studies of Hg_1-xMn_xTe epitaxial films
  
  Hallam, T., Halder, S., Hudson, J., Li, C., Funaki, M., Lewis, J., Brinkman, A., & Tanner, B. (1993). X-ray scattering and topography studies of Hg<SUB>1-x</SUB>Mn<SUB>x</SUB>Te epitaxial films. Journal of Physics D Applied Physics, 26, A161-A166.
• The MOVPE growth and characterization of Hg_1-xMn_xTe
  
  Funaki, M., Lewis, J., Hallam, T., Li, C., Halder, S., Brinkman, A., & Tanner, B. (1993). The MOVPE growth and characterization of Hg<SUB>1-x</SUB>Mn<SUB>x</SUB>Te. Semiconductor Science and Technology, 8, 200-.
• High-resolution X-ray-diffraction Of Hg1-xmnxte Epitaxial-films
  
  Tanner, B., Hallam, T., Funaki, M., & Brinkman, A. (1993). High-resolution X-ray-diffraction Of Hg1-xmnxte Epitaxial-films. Evolution Of Surface And Thin Film Microstructure, 280, 635-640.
• X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth
  
  Barnett, S., Whitehouse, C., Keir, A., Clark, G., Usher, B., Tanner, B., Emeny, M., & Johnson, A. (1993). X-ray topography of lattice relaxation in strained layer semiconductors: post-growth studies and a new facility for in situ topography during MBE growth. Journal of Physics D Applied Physics, 26, A45-A49.
• X-ray scattering from multiple-layer structures forming Bragg-case interferometers
  
  Tanner, B. (1993). X-ray scattering from multiple-layer structures forming Bragg-case interferometers. Journal of Physics D Applied Physics, 26, A151-A155.
• In-situ Synchrotron X-ray Studies Of Epitaxial Strained-layer Growth-processes
  
  Whitehouse, C., Barnett, S., Usher, B., Cullis, A., Keir, A., Johnson, A., Clark, G., Tanner, B., Spirkl, W., Lunn, B., Hagston, W., & Hogg, J. (1993). In-situ Synchrotron X-ray Studies Of Epitaxial Strained-layer Growth-processes. Institute of Physics Conference Series., 563-568.
• Measurement of inter-particle interactions in a single magnetic ink aggregate
  
  Westwood, S., Lewis, V., O’Grady, K., & Tanner, B. (1993). Measurement of inter-particle interactions in a single magnetic ink aggregate. Journal of Magnetism and Magnetic Materials, 125, L247-L250.
• Characterization Of Magnetic Multilayers By Grazing-incidence X-ray Reflectivity
  
  Tanner, B., & Hudson, J. (1992). Characterization Of Magnetic Multilayers By Grazing-incidence X-ray Reflectivity. IEEE Transactions on Magnetics, 28, 2736-2741.
• Internal magnetic domain structure changes in thick TbAl₂ crystals revealed by polarized neutron topography
  
  Tanner, B., Baruchel, J., & Abell, J. (1992). Internal magnetic domain structure changes in thick TbAl₂ crystals revealed by polarized neutron topography. Journal of Magnetism and Magnetic Materials, 104, 317-318.
• Time-dependent magnetization in the 1D spin glass Fe₂TiO₅
  
  Tanner, B., Pilkington, C., & Wanklyn, B. (1992). Time-dependent magnetization in the 1D spin glass Fe₂TiO₅. Journal of Magnetism and Magnetic Materials, 104, 1611-1612.
• Synchrotron X-radiation Topography
  
  Tanner, B., & Bowen, D. (1992). Synchrotron X-radiation Topography. Materials Science Reports., 8, 369-407.
• Small-angle X-ray scattering study of ferrofluids
  
  Bissell, P., Chantrell, R., Hoon, S., Lambrick, D., & Tanner, B. (1992). Small-angle X-ray scattering study of ferrofluids. Journal of Magnetism and Magnetic Materials, 104, 1551-1552.
• An MBE growth facility for real-time in situ synchrotron x-ray topography studies of strained-layer III-V epitaxial materials
  
  Whitehouse, C., Barnett, S., Soley, D., Quarrell, J., Aldridge, S., Cullis, A., Emeny, M., Johnson, A., Clarke, G., Lamb, W., Tanner, B., Cottrell, S., Lunn, B., Hogg, C., & Hagston, W. (1992). An MBE growth facility for real-time in situ synchrotron x-ray topography studies of strained-layer III-V epitaxial materials. Review of Scientific Instruments, 63, 634-637.
• Coupling between antiferro and ferromagnetic domains in hematite
  
  Sandonís, J., Baruchel, J., Tanner, B., Fillion, G., Kvardakov, V., & Podurets, K. (1992). Coupling between antiferro and ferromagnetic domains in hematite. Journal of Magnetism and Magnetic Materials, 104, 350-352.
• Thermal-degradation Of Sige Interfaces Studied By X-ray Reflectivity And Diffraction
  
  Hudson, J., Powell, A., Bowen, D., Wormington, M., Tanner, B., Kubiak, R., & Parker, E. (1992). Thermal-degradation Of Sige Interfaces Studied By X-ray Reflectivity And Diffraction. Thin Films : Stress And Mechanical Properties Iii, 239, 455-460.
• Principles And Performance Of A Pc-based Program For Simulation Of Grazing-incidence X-ray Reflectivity Profiles
  
  Wormington, M., Bowen, D., & Tanner, B. (1992). Principles And Performance Of A Pc-based Program For Simulation Of Grazing-incidence X-ray Reflectivity Profiles. Structure And Properties Of Interfaces In Materials, 238, 119-124.
• Grazing-incidence X-ray Reflectometry Studies Of Cadmium Arachidate Langmuir-blodgett-films
  
  Tanner, B., Bowen, D., Petty, M., Swaminathan, S., & Grunfeld, F. (1992). Grazing-incidence X-ray Reflectometry Studies Of Cadmium Arachidate Langmuir-blodgett-films. Interface Dynamics And Growth, 237, 281-286.
• Structural analysis of high-T_c epitaxial GdBa₂Cu₃O_7-x superconducting thin films
  
  Dai, D., Green, G., Tanner, B., Cui, S., Mai, Z., Li, H., Yi, H., & Wang, R. (1991). Structural analysis of high-T<SUB>c</SUB> epitaxial GdBa₂Cu₃O<SUB>7-x</SUB> superconducting thin films. Superconductor Science Technology, 4, 348-352.
• X-ray Reflectometry From Semiconductor Surfaces And Interfaces
  
  Tanner, B., Miles, S., Bowen, D., Hart, L., & Loxley, N. (1991). X-ray Reflectometry From Semiconductor Surfaces And Interfaces. Advances In Surface And Thin Film Diffraction, 208, 345-350.
• X-ray Topography Studies Of Oxygen Precipitates In Mcz Silicon
  
  Holland, A., Green, G., Tanner, B., & Mai, Z. (1991). X-ray Topography Studies Of Oxygen Precipitates In Mcz Silicon. Defects In Materials, 209, 475-480.
• Measurement of aluminum concentration in epitaxial layers of Al_xGa_{1 - x}As on GaAs by double axis x-ray diffractometry
  
  Tanner, B., Turnbull, A., Stanley, C., Kean, A., & McElhinney, M. (1991). Measurement of aluminum concentration in epitaxial layers of Al<SUB>x</SUB>Ga<SUB>1 - x</SUB>As on GaAs by double axis x-ray diffractometry. Applied Physics Letters, 59, 2272-2274.
• Principles And Performance Of A Pc-based Program For Simulation Of Double-axis X-ray Rocking Curves Of Thin Epitaxial-films
  
  Bowen, D., Loxley, N., Tanner, B., Cooke, L., & Capano, M. (1991). Principles And Performance Of A Pc-based Program For Simulation Of Double-axis X-ray Rocking Curves Of Thin Epitaxial-films. Advances In Surface And Thin Film Diffraction, 208, 113-118.
• Dislocation Images In X-ray Section Topographs Of Curved Crystals
  
  Green, G., Loxley, N., & Tanner, B. (1991). Dislocation Images In X-ray Section Topographs Of Curved Crystals. Journal of Applied Crystallography, 24, 304-311.
• High-resolution Double Crystal Diffractometry Of High-tc Superconducting Epitaxial Gd-ba-cu-o Films
  
  Dai, D., Green, G., Tanner, B., Li, H., Yi, H., & Wang, R. (1991). High-resolution Double Crystal Diffractometry Of High-tc Superconducting Epitaxial Gd-ba-cu-o Films. Defects In Materials, 209, 841-846.
• Misfit Dislocations At The Critical Thickness For Ingaas/gaas Strained Layers
  
  Green, G., Tanner, B., Turnbull, A., Barnett, S., Emeny, M., & Whitehouse, C. (1991). Misfit Dislocations At The Critical Thickness For Ingaas/gaas Strained Layers. Evolution Of Thin-Film And Surface Microstructure, 202, 507-512.
• Double Axis X-ray-diffractometry Analysis Of The Homoepitaxial Interface Between Substrate And Buffer Layer
  
  Green, G., Tanner, B., & Kightley, P. (1991). Double Axis X-ray-diffractometry Analysis Of The Homoepitaxial Interface Between Substrate And Buffer Layer. Advances In Surface And Thin Film Diffraction, 208, 315-320.
• The Performance Of Channel Cut Collimators For Precision X-ray-diffraction Studies Of Epitaxial Layers
  
  Loxley, N., Bowen, D., & Tanner, B. (1991). The Performance Of Channel Cut Collimators For Precision X-ray-diffraction Studies Of Epitaxial Layers. Advances In Surface And Thin Film Diffraction, 208, 107-112.
• Asymmetric Relaxation In Epitaxial Layers Of Iii-v Compounds
  
  Turnbull, A., Green, G., Tanner, B., & Halliwell, M. (1991). Asymmetric Relaxation In Epitaxial Layers Of Iii-v Compounds. Evolution Of Thin-Film And Surface Microstructure, 202, 513-518.
• Nucleation Of Misfit Dislocations In Strained-layer Ingaas On Gaas
  
  Green, G., Tanner, B., Barnett, S., Emeny, M., Pitt, A., Whitehouse, C., & Clark, G. (1990). Nucleation Of Misfit Dislocations In Strained-layer Ingaas On Gaas. Philosophical Magazine Letters, 62, 131-137.
• High-resolution X-ray-diffraction And Topography For Crystal Characterization
  
  Tanner, B. (1990). High-resolution X-ray-diffraction And Topography For Crystal Characterization. Journal of Crystal Growth, 99, 1315-1323.
• Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization.
  
  Loxley, N., Bowen, D., & Tanner, B. (1990). Application of a Desk-Side Double-Axis X-Ray Diffractometer for Very Large Area Epilayer Characterization. MRS Online Proceedings Library, 208, 119-124. https://doi.org/10.1557/proc-208-119
• Magnetic-properties Of Welds In High-strength Pearlitic Steels
  
  Thompson, S., Allen, P., & Tanner, B. (1990). Magnetic-properties Of Welds In High-strength Pearlitic Steels. IEEE Transactions on Magnetics, 26, 1984-1986.
• The magnetic properties of plastically deformed steels
  
  Thompson, S., & Tanner, B. (1990). The magnetic properties of plastically deformed steels. Journal of Magnetism and Magnetic Materials, 83, 221-222.
• Effect Of Interface Structure On The X-ray Double Crystal Rocking Curve Peak Position From Very Thin-layers In The Highly Asymmetric Bragg Geometry
  
  Cockerton, S., Miles, S., Green, G., & Tanner, B. (1990). Effect Of Interface Structure On The X-ray Double Crystal Rocking Curve Peak Position From Very Thin-layers In The Highly Asymmetric Bragg Geometry. Journal of Crystal Growth, 99, 1324-1328.
• Theoretical Modeling And Czochralski Growth Of High Perfection Nickel Single-crystals
  
  Alourfi, M., & Tanner, B. (1990). Theoretical Modeling And Czochralski Growth Of High Perfection Nickel Single-crystals. Journal of Crystal Growth, 99, 139-144.
• Computer simulations of indications in magnetic particle inspection
  
  McCoy, J., & Tanner, B. (1990). Computer simulations of indications in magnetic particle inspection. Journal of Physics D Applied Physics, 23, 593-599.
• Assessment Of Thin Heteroepitaxial Layers Using Skew Angle Asymmetrical X-ray Double Crystal Diffraction
  
  Miles, S., Green, G., Tanner, B., Halliwell, M., & Lyons, M. (1989). Assessment Of Thin Heteroepitaxial Layers Using Skew Angle Asymmetrical X-ray Double Crystal Diffraction. Materials Research Society Symposia Proceedings, 138, 539-544.
• X-ray Section Topography Of Hydrogen Precipitates In Silicon
  
  Cui, S., Green, G., & Tanner, B. (1989). X-ray Section Topography Of Hydrogen Precipitates In Silicon. Materials Research Society Symposia Proceedings, 138, 71-76.
• LETTER TO THE EDITOR: Influence of plastic deformation on Barkhausen power spectra in steels
  
  Birkett, A., Corner, W., Tanner, B., & Thompson, S. (1989). LETTER TO THE EDITOR: Influence of plastic deformation on Barkhausen power spectra in steels. Journal of Physics D Applied Physics, 22, 1240-1242.
• Magnetisation of inks for magnetic particle inspection
  
  McCoy, J., & Tanner, B. (1989). Magnetisation of inks for magnetic particle inspection. Journal of Physics D Applied Physics, 22, 1366-1371.
• Double Crystal Synchrotron X-ray-diffraction Study Of Stoichiometry In Gallium-arsenide
  
  Cockerton, S., Green, G., & Tanner, B. (1989). Double Crystal Synchrotron X-ray-diffraction Study Of Stoichiometry In Gallium-arsenide. Materials Research Society Symposia Proceedings, 138, 65-70.
• X-ray Topography And Precision Diffractometry Of Semiconducting Materials
  
  Tanner, B. (1989). X-ray Topography And Precision Diffractometry Of Semiconducting Materials. Journal of The Electrochemical Society, 136, 3438-3443.
• Measurement Of Aluminum Concentration In Gaalas Epitaxial Layers By Double-axis X-ray-diffraction
  
  Tanner, B., Miles, S., Peterson, G., & Sacks, R. (1988). Measurement Of Aluminum Concentration In Gaalas Epitaxial Layers By Double-axis X-ray-diffraction. Materials Letters, 7, 239-241.
• Interference structures in double-crystal X-ray rocking curves from very thin multiple epitaxial layers
  
  Tanner, B., & Halliwell, M. (1988). Interference structures in double-crystal X-ray rocking curves from very thin multiple epitaxial layers. Semiconductor Science and Technology, 3, 967-972.
• Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity
  
  Lucas, C., Hatton, P., Bates, S., Ryan, T., Miles, S., & Tanner, B. (1988). Characterization of nanometer-scale epitaxial structures by grazing-incidence x-ray diffraction and specular reflectivity. Journal of Applied Physics, 63, 1936-1941.
• Domain-structures In Hematite (alpha-fe2o3)
  
  Tanner, B., Clark, G., & Safa, M. (1988). Domain-structures In Hematite (alpha-fe2o3). Philosophical Magazine : Physics of Condensed Matter. B, Electronic, Optical and Magnetic Properties., 57, 361-377.
• X-ray topography of the coherency breakdown in Ge_xSi_{1 - x}/Si(100)
  
  Eaglesham, D., Kvam, E., Maher, D., Humphreys, C., Green, G., Tanner, B., & Bean, J. (1988). X-ray topography of the coherency breakdown in Ge<SUB>x</SUB>Si<SUB>1 - x</SUB>/Si(100). Applied Physics Letters, 53, 2083-2085.
• The parameterization of virgin B-H curves of high strength steels
  
  Willcock, S., Tanner, B., & Mundell, P. (1988). The parameterization of virgin B-H curves of high strength steels. Journal of Magnetism and Magnetic Materials, 72, 45-51.
• Magnetic And Metallurgical Properties Of High-tensile Steels
  
  Tanner, B., Szpunar, J., Willcock, S., Morgan, L., & Mundell, P. (1988). Magnetic And Metallurgical Properties Of High-tensile Steels. Journal of Materials Science, 23, 4534-4540.
• Ferroelastic Domain-structures And Phase-transitions In Barium Sodium Niobate
  
  Jiang, S., Surowiec, M., & Tanner, B. (1988). Ferroelastic Domain-structures And Phase-transitions In Barium Sodium Niobate. Journal of Applied Crystallography, 21, 145-150.
• Simulation Of Particle Trajectories In Magnetic Particle Inspection
  
  McCoy, J., & Tanner, B. (1988). Simulation Of Particle Trajectories In Magnetic Particle Inspection. IEEE Transactions on Magnetics, 24, 1665-1667.
• X-ray Topographic Study Of Dislocations Around Indents On (111) Surfaces Of Indium-antimonide
  
  Surowiec, M., & Tanner, B. (1987). X-ray Topographic Study Of Dislocations Around Indents On (111) Surfaces Of Indium-antimonide. Journal of Applied Crystallography, 20, 499-504.
• Bragg Case X-ray Moire Patterns Observed In Gaalas/gaas Laser Structures
  
  Chu, X., & Tanner, B. (1987). Bragg Case X-ray Moire Patterns Observed In Gaalas/gaas Laser Structures. Materials Letters, 5, 153-155.
• The magnetic properties of seamless steel pipe
  
  Willcock, S., Tanner, B., & Mundell, P. (1987). The magnetic properties of seamless steel pipe. Journal of Magnetism and Magnetic Materials, 66, 153-157.
• High-voltage Lorentz Electron-microscopy Studies Of Domain-structures And Magnetization Processes In Pearlitic Steels
  
  Hetherington, M., Jakubovics, J., Szpunar, J., & Tanner, B. (1987). High-voltage Lorentz Electron-microscopy Studies Of Domain-structures And Magnetization Processes In Pearlitic Steels. Philosophical Magazine : Physics of Condensed Matter. B, Electronic, Optical and Magnetic Properties., 56, 561-577.
• The Contrast Of Stacking-faults In Optical Birefringence Micrographs Of Diamond
  
  Jiang, S., Lang, A., & Tanner, B. (1987). The Contrast Of Stacking-faults In Optical Birefringence Micrographs Of Diamond. Philosophical Magazine A-Physics Of Condensed Matter Structure Defects And Mechanical Properties, 56, 367-375.
• Neutron topographic investigation of the Morin transition in flux-grown crystals of α-Fe₂O₃
  
  Baruchel, J., Clark, G., Tanner, B., & Watts, B. (1987). Neutron topographic investigation of the Morin transition in flux-grown crystals of α-Fe₂O₃. Journal of Magnetism and Magnetic Materials, 68, 374-378.
• X-ray Topographic Investigation Of Microdeformation Of Insb Single-crystals
  
  Surowiec, M., & Tanner, B. (1987). X-ray Topographic Investigation Of Microdeformation Of Insb Single-crystals. Philosophical Magazine A-Physics Of Condensed Matter Structure Defects And Mechanical Properties, 55, 791-805.
• Double crystal x-ray rocking curves of multiple layer structures
  
  Chu, X., & Tanner, B. (1987). Double crystal x-ray rocking curves of multiple layer structures. Semiconductor Science and Technology, 2, 765-771.
• Real-time And Stroboscopic Topography
  
  Tanner, B., & Cringean, J. (1987). Real-time And Stroboscopic Topography. Progress in Crystal Growth and Characterization of Materials, 14, 403-424.
• The Application Of Harmonic-analysis To The Magnetic-properties Of High-tensile Steels
  
  Willcock, S., & Tanner, B. (1986). The Application Of Harmonic-analysis To The Magnetic-properties Of High-tensile Steels. Materials Letters, 4, 307-312.
• X-ray Topographic Studies In The Peoples-republic-of-china
  
  Hsu, S., & Tanner, B. (1986). X-ray Topographic Studies In The Peoples-republic-of-china. Progress in Crystal Growth and Characterization of Materials, 13, 63-75.
• Interference peaks in double-crystal x-ray rocking curves of laser structures
  
  Chu, X., & Tanner, B. (1986). Interference peaks in double-crystal x-ray rocking curves of laser structures. Applied Physics Letters, 49, 1773-1775.
• The Structure And Behavior Of Inks For Magnetic Particle Inspection
  
  Tanner, B., McCoy, J., Willcock, S., Hetherington, M., & Jakubovics, J. (1986). The Structure And Behavior Of Inks For Magnetic Particle Inspection. Journal of Materials Science Letters, 5, 296-298.
• LETTER TO THE EDITOR: Double axis X-ray diffractometry at glancing angles
  
  Tanner, B., & Hill, M. (1986). LETTER TO THE EDITOR: Double axis X-ray diffractometry at glancing angles. Journal of Physics D Applied Physics, 19, L229-L235.
• Simulation Of X-ray Double-crystal Rocking Curves Of Multiple And Inhomogeneous Heteroepitaxial Layers
  
  Hill, M., Tanner, B., Halliwell, M., & Lyons, M. (1985). Simulation Of X-ray Double-crystal Rocking Curves Of Multiple And Inhomogeneous Heteroepitaxial Layers. Journal of Applied Crystallography, 18, 446-451.
• Low temperature synchrotron X-radiation topography observations of magnetic domains in TbAl₂
  
  Clark, G., Tanner, B., & Abell, J. (1985). Low temperature synchrotron X-radiation topography observations of magnetic domains in TbAl₂. Journal of Magnetism and Magnetic Materials, 49, 317-324.
• Magnetic fluids - part 2
  
  Hoon, S., & Tanner, B. (1985). Magnetic fluids - part 2. Physics Education, 20, 120-123. https://doi.org/10.1088/0031-9120/20/3/310
• Magnetic fluids - part 1
  
  Hoon, S., & Tanner, B. (1985). Magnetic fluids - part 1. Physics Education, 20, 61-65. https://doi.org/10.1088/0031-9120/20/2/307
• Time-dependent Resistivity In Carbon-fiber Sheets
  
  Hoon, S., Shelton, A., & Tanner, B. (1985). Time-dependent Resistivity In Carbon-fiber Sheets. Journal of Materials Science, 20, 3311-3319.
• The magnetocrystalline anisotropy of cobalt
  
  Paige, D., Szpunar, B., & Tanner, B. (1984). The magnetocrystalline anisotropy of cobalt. Journal of Magnetism and Magnetic Materials, 44, 239-248.
• Contrast Of Heavily Decorated Dislocations In Optical Birefringence Micrographs
  
  Tanner, B. (1984). Contrast Of Heavily Decorated Dislocations In Optical Birefringence Micrographs. Philosophical Magazine A-Physics Of Condensed Matter Structure Defects And Mechanical Properties, 49, 435-444.
• High-precision Torque Hysteresis Measurements On Fine Particle-systems
  
  Paige, D., Hoon, S., Tanner, B., & Ogrady, K. (1984). High-precision Torque Hysteresis Measurements On Fine Particle-systems. IEEE Transactions on Magnetics, 20, 1852-1854.
• An Assessment Of Diamond Turning For The Production Of Silicon X-ray Optical-elements
  
  Gani, S., Tanner, B., Mckenney, T., Hingle, H., & Bowen, D. (1984). An Assessment Of Diamond Turning For The Production Of Silicon X-ray Optical-elements. Journal of Applied Crystallography, 17, 111-117.
• Preparation And Properties Of Metallic Iron Ferrofluids
  
  Kilner, M., Hoon, S., Lambrick, D., Potton, J., & Tanner, B. (1984). Preparation And Properties Of Metallic Iron Ferrofluids. IEEE Transactions on Magnetics, 20, 1735-1737.
• Grain Shape And Distribution Of The Grain-boundary Density In Polycrystalline Materials
  
  Szpunar, J., & Tanner, B. (1984). Grain Shape And Distribution Of The Grain-boundary Density In Polycrystalline Materials. Journal of Materials Science, 19, 3249-3254.
• Assessment Of Epitaxial Layers By Automated Scanning Double Axis Diffractometry
  
  Halliwell, M., Lyons, M., Tanner, B., & Ilczyszyn, P. (1983). Assessment Of Epitaxial Layers By Automated Scanning Double Axis Diffractometry. Journal of Crystal Growth, 65, 672-678.
• Evidence For Very-large-area Magnetic Domain-walls In Hematite (alpha-fe2o3)
  
  Clark, G., Goddard, P., Nicholson, J., Tanner, B., & Wanklyn, B. (1983). Evidence For Very-large-area Magnetic Domain-walls In Hematite (alpha-fe2o3). Philosophical Magazine : Physics of Condensed Matter. B, Electronic, Optical and Magnetic Properties., 47, 307-313.
• Time-dependent magnetization in fine-particle ferromagnetic systems
  
  Chantrell, R., Hoon, S., & Tanner, B. (1983). Time-dependent magnetization in fine-particle ferromagnetic systems. Journal of Magnetism and Magnetic Materials, 38, 133-141.
• Preparation and properties of nickel ferrofluids
  
  Hoon, S., Kilner, M., Russell, G., & Tanner, B. (1983). Preparation and properties of nickel ferrofluids. Journal of Magnetism and Magnetic Materials, 39, 107-110.
• Harmonic-analysis Of B-h Loops Of Constructional Steel
  
  Willcock, S., & Tanner, B. (1983). Harmonic-analysis Of B-h Loops Of Constructional Steel. IEEE Transactions on Magnetics, 19, 2145-2147.
• Harmonic-analysis Of B-h Loops
  
  Willcock, S., & Tanner, B. (1983). Harmonic-analysis Of B-h Loops. IEEE Transactions on Magnetics, 19, 2265-2270.
• High sensitivity measurements of néel relaxation in fine particle ferromagnetic systems
  
  Cayless, A., Hoon, S., Tanner, B., Chantrell, R., & Kilner, M. (1983). High sensitivity measurements of néel relaxation in fine particle ferromagnetic systems. Journal of Magnetism and Magnetic Materials, 30, 303-311.
• Direct optical observation of ferromagnetic domains
  
  Parpia, D., Tanner, B., & Lord, D. (1983). Direct optical observation of ferromagnetic domains. Nature, 303, 684-.
• Determination of the magnetic anisotropy of ferrofluids from torque magnetometry data
  
  Chantrell, R., Tanner, B., & Hoon, S. (1983). Determination of the magnetic anisotropy of ferrofluids from torque magnetometry data. Journal of Magnetism and Magnetic Materials, 38, 83-92.
• Torque magnetometry of magnetic fluids
  
  Hoon, S., Tanner, B., & Kilner, M. (1983). Torque magnetometry of magnetic fluids. Journal of Magnetism and Magnetic Materials, 39, 30-34.
• Stroboscopic X-ray Topography Of Surface Acoustic-wave Devices
  
  Whatmore, R., Goodard, P., & Tanner, B. (1983). Stroboscopic X-ray Topography Of Surface Acoustic-wave Devices. IEEE Transactions on Sonics and Ultrasonics, 30, 209-209.
• Assessment of the crystal lattice perfection of rare earth and intermetallic single crystals by x-ray topography
  
  Goddard, P., Clark, G., Corner, W., Tanner, B., Abell, J., Fort, D., & Jones, D. (1982). Assessment of the crystal lattice perfection of rare earth and intermetallic single crystals by x-ray topography. Journal of Magnetism and Magnetic Materials, 29, 39-45.
• LETTERS: Standing waves
  
  Isenberg, C., Hoon, S., & Tanner, B. (1982). LETTERS: Standing waves. Physics Education, 17, 4-.
• Measurement of the spontaneous magnetostriction of terbium by x-ray diffractometry
  
  Clark, G., Tanner, B., Farrant, S., & Jones, D. (1982). Measurement of the spontaneous magnetostriction of terbium by x-ray diffractometry. Journal of Magnetism and Magnetic Materials, 29, 71-78.
• Synchrotron X-radiation Topography Studies Of The Magnetization Process In Tb0.27dy0.73fe2
  
  Clark, G., Tanner, B., & Savage, H. (1982). Synchrotron X-radiation Topography Studies Of The Magnetization Process In Tb0.27dy0.73fe2. Philosophical Magazine : Physics of Condensed Matter. B, Electronic, Optical and Magnetic Properties., 46, 331-343.
• Direct imaging of travelling Rayleigh waves by stroboscopic X-ray topography
  
  Whatmore, R., Goddard, P., Tanner, B., & Clark, G. (1982). Direct imaging of travelling Rayleigh waves by stroboscopic X-ray topography. Nature, 299, 44-46.
• A robust inexpensive torque magnetometer with on-line data analysis
  
  Paige, D., & Tanner, B. (1982). A robust inexpensive torque magnetometer with on-line data analysis. Journal of Physics E Scientific Instruments, 15, 128-131.
• Magnetic-properties Of Electrodeposited Iron Foil
  
  Maccormack, I., Corner, W., & Tanner, B. (1981). Magnetic-properties Of Electrodeposited Iron Foil. IEEE Transactions on Magnetics, 17, 2940-2942.
• Diffraction Techniques In The Study Of Magnetic Domains And Magnetostriction
  
  Tanner, B. (1981). Diffraction Techniques In The Study Of Magnetic Domains And Magnetostriction. Science Progress, 67, 411-440.
• The physics of music
  
  Hoon, S., & Tanner, B. (1981). The physics of music. Physics Education, 16, 300-311.
• Low temperature thermometry using inexpensive silicon diodes
  
  Waltham, N., Clark, G., & Tanner, B. (1981). Low temperature thermometry using inexpensive silicon diodes. Physics Education, 16, 104-107.
• X-ray Topographic Assessment Of Flux-grown Crystals Of Rare-earth Germanates (r2ge2o7)
  
  Clark, G., Tanner, B., & Wanklyn, B. (1980). X-ray Topographic Assessment Of Flux-grown Crystals Of Rare-earth Germanates (r2ge2o7). Journal of Materials Science, 15, 1328-1330.
• Magnetic domain structures in high purity single crystal terbium
  
  Corner, W., Bareham, H., Smith, R., Saad, F., Tanner, B., Farrant, S., Jones, D., Beaudry, B., & Gschneidner, K. (1980). Magnetic domain structures in high purity single crystal terbium. Journal of Magnetism and Magnetic Materials, 15, 1488-1490.
• Deformation Studies Of Initially Dislocation-free Copper-crystals .3. Insitu X-ray Topography
  
  Buckleygolder, I., & Tanner, B. (1980). Deformation Studies Of Initially Dislocation-free Copper-crystals .3. Insitu X-ray Topography. Philosophical Magazine A-Physics Of Condensed Matter Structure Defects And Mechanical Properties, 42, 559-573.
• Magneto-optical experiments on rare earth garnet films
  
  Tanner, B. (1980). Magneto-optical experiments on rare earth garnet films. American Journal of Physics, 48, 59-63.
• Magnetostriction measurements on the model Heisenberg antiferromagnet KNiF₃
  
  Money, D., Paige, D., Corner, W., & Tanner, B. (1980). Magnetostriction measurements on the model Heisenberg antiferromagnet KNiF₃. Journal of Magnetism and Magnetic Materials, 15, 603-604.
• The magnetic domain structure of gadolinium between 230 and 293 K
  
  Smith, R., Corner, W., & Tanner, B. (1980). The magnetic domain structure of gadolinium between 230 and 293 K. Journal of Magnetism and Magnetic Materials, 20, 265-270.
• A double axis X-ray diffractometer for magnetostriction measurements
  
  Jones, F., & Tanner, B. (1980). A double axis X-ray diffractometer for magnetostriction measurements. Journal of Physics E Scientific Instruments, 13, 1183-1188.
• An apparatus for observing magnetic domains at low temperatures and in large applied fields
  
  Smith, R., Corner, W., & Tanner, B. (1980). An apparatus for observing magnetic domains at low temperatures and in large applied fields. Journal of Physics E Scientific Instruments, 13, 620-622.
• Anti-ferromagnetic Domains
  
  Tanner, B. (1979). Anti-ferromagnetic Domains. Contemporary Physics, 20, 187-210.
• Magnetization Process In Rare-earth Iron Laves Phase-compounds
  
  Clark, G., Tanner, B., Sery, R., & Savage, H. (1979). Magnetization Process In Rare-earth Iron Laves Phase-compounds. Journal De Physique., 40, 183-183.
• Evidence Of Interactions Between Domain-walls And A Dislocation Bundle In Synchrotron X-radiation Topographs Of Iron Whisker Crystals
  
  Chikaura, Y., & Tanner, B. (1979). Evidence Of Interactions Between Domain-walls And A Dislocation Bundle In Synchrotron X-radiation Topographs Of Iron Whisker Crystals. Japanese Journal of Applied Physics, 18, 1389-1390.
• Deformation Studies Of Initially Dislocation-free Copper-crystals .2. Constant Strain Rate Tests On Cr-plated Crystals
  
  Buckleygolder, I., & Tanner, B. (1979). Deformation Studies Of Initially Dislocation-free Copper-crystals .2. Constant Strain Rate Tests On Cr-plated Crystals. Philosophical Magazine A-Physics Of Condensed Matter Structure Defects And Mechanical Properties, 39, 551-562.
• Ferromagnetism In Ancient Copper-based Coinage
  
  Tanner, B., Macdowall, D., Maccormack, I., & Smith, R. (1979). Ferromagnetism In Ancient Copper-based Coinage. Nature, 280, 46-48.
• Application Of X-ray Synchrotron Topography To Insitu Studies Of Recrystallization
  
  Maccormack, I., & Tanner, B. (1978). Application Of X-ray Synchrotron Topography To Insitu Studies Of Recrystallization. Journal of Applied Crystallography, 11, 40-43.
• Quantitative reflectivity measurements
  
  Tanner, B. (1978). Quantitative reflectivity measurements. Physics Education, 13, 120-122.
• Flux Growth And Characterization By X-ray Topography Of Rare-earth Arsenates
  
  Smith, S., Garton, G., Tanner, B., & Midgley, D. (1978). Flux Growth And Characterization By X-ray Topography Of Rare-earth Arsenates. Journal of Materials Science, 13, 620-626.
• Domain configurations in single crystal TbFe₂ and Tb_0.27Dy_0.73Fe₂
  
  Sery, R., Savage, H., Tanner, B., & Clark, G. (1978). Domain configurations in single crystal TbFe₂ and Tb<SUB>0.27</SUB>Dy<SUB>0.73</SUB>Fe₂. Journal of Applied Physics, 49, 2010-2012.
• γ-ray diffractometry of lattice distortions in TbVO₄ caused by the Jahn-Teller phase transition
  
  Smith, S., & Tanner, B. (1978). γ-ray diffractometry of lattice distortions in TbVO₄ caused by the Jahn-Teller phase transition. Journal of Physics C Solid State Physics, 11, L717-L720.
• Anti-ferromagnetic Domain-wall Motion In Knif3 And Kcof3 Observed By X-ray Synchrotron Topography
  
  Safa, M., & Tanner, B. (1978). Anti-ferromagnetic Domain-wall Motion In Knif3 And Kcof3 Observed By X-ray Synchrotron Topography. Philosophical Magazine : Physics of Condensed Matter. B, Electronic, Optical and Magnetic Properties., 37, 739-750.
• The effect of nonmagnetic inclusions on the easy direction of gadolinium
  
  Smith, R., Tanner, B., & Corner, W. (1977). The effect of nonmagnetic inclusions on the easy direction of gadolinium. Journal of Physics F Metal Physics, 7, L229-L232.
• Cryogenic X-ray Topography Using Synchrotron Radiation
  
  Tanner, B., Safa, M., & Midgley, D. (1977). Cryogenic X-ray Topography Using Synchrotron Radiation. Journal of Applied Crystallography, 10, 91-99.
• Simple Automatic Cassette For X-ray Synchrotron Topography
  
  Buckleygolder, I., Tanner, B., & Clark, G. (1977). Simple Automatic Cassette For X-ray Synchrotron Topography. Journal of Applied Crystallography, 10, 502-502.
• LETTERS: Narrow-band model
  
  Warren, J., & Tanner, B. (1977). LETTERS: Narrow-band model. Physics Education, 12, 211-212.
• Direction Of Dislocations In Flux-grown Crystals
  
  Safa, M., Tanner, B., Klapper, H., & Wanklyn, B. (1977). Direction Of Dislocations In Flux-grown Crystals. Philosophical Magazine, 35, 811-816.
• Behavior Of Antiferromagnetic Domains In Knif3
  
  Safa, M., & Tanner, B. (1977). Behavior Of Antiferromagnetic Domains In Knif3. Physica A: Statistical Mechanics and Its Applications, 86, 1347-1348.
• Perfection Studies Of Kmf3 (m=fe,co,ni) Crystals Grown From Flux
  
  Safa, M., Tanner, B., Garrard, B., & Wanklyn, B. (1977). Perfection Studies Of Kmf3 (m=fe,co,ni) Crystals Grown From Flux. Journal of Crystal Growth, 39, 243-249.
• Dislocation Contrast In X-ray Synchrotron Topographs
  
  Tanner, B., Midgley, D., & Safa, M. (1977). Dislocation Contrast In X-ray Synchrotron Topographs. Journal of Applied Crystallography, 10, 281-286.
• Crystal Assessment By X-ray Topography Using Synchrotron Radiation
  
  Tanner, B. (1977). Crystal Assessment By X-ray Topography Using Synchrotron Radiation. Progress in Crystal Growth and Characterization of Materials, 1, 23-56.
• LETTERS: Narrow-band model revisited
  
  Tanner, B. (1976). LETTERS: Narrow-band model revisited. Physics Education, 11, 452-453.
• Observation of magnetic domain wall movements by X-ray topography using synchrotron radiation
  
  Tanner, B., Safa, M., Midgley, D., & Bordas, J. (1976). Observation of magnetic domain wall movements by X-ray topography using synchrotron radiation. Journal of Magnetism and Magnetic Materials, 1, 337-341.
• The narrow-band model and semiconductor theory
  
  Tanner, B. (1976). The narrow-band model and semiconductor theory. Physics Education, 11, 97-99.
• Magnetic domains
  
  Corner, W., & Tanner, B. (1976). Magnetic domains. Physics Education, 11, 356-362.
• Growth And Perfection Of Rare-earth Aluminate And Dyfeo3 Crystals With Moo3 As Additive
  
  Wanklyn, B., Midgley, D., & Tanner, B. (1975). Growth And Perfection Of Rare-earth Aluminate And Dyfeo3 Crystals With Moo3 As Additive. Journal of Crystal Growth, 29, 281-288.
• The easy direction of magnetization in gadolinium
  
  Corner, W., & Tanner, B. (1975). The easy direction of magnetization in gadolinium. Journal of Physics C Solid State Physics, 9, 627-633.
• Study Of Perfection Of Flux-grown Rare-earth Vanadates By X-ray Topography
  
  Tanner, B., & Smith, S. (1975). Study Of Perfection Of Flux-grown Rare-earth Vanadates By X-ray Topography. Journal of Crystal Growth, 28, 77-84.
• Observation Of Antiferromagnetic Domains In Knif3 By X-ray Topography
  
  Safa, M., Midgley, D., & Tanner, B. (1975). Observation Of Antiferromagnetic Domains In Knif3 By X-ray Topography. Physica Status Solidi (a), 28, K89-K91.
• X-ray Topographic Study Of Perfection Of Flux-grown Rare-earth Phosphates
  
  Tanner, B., & Smith, S. (1975). X-ray Topographic Study Of Perfection Of Flux-grown Rare-earth Phosphates. Journal of Crystal Growth, 30, 323-326.
• Perfection Of Flux Grown Crystals
  
  Tanner, B. (1974). Perfection Of Flux Grown Crystals. Journal of Crystal Growth, 24, 637-640.
• Contrast Of Crystal Defects Under Polarized-light
  
  Tanner, B., & Fathers, D. (1974). Contrast Of Crystal Defects Under Polarized-light. Philosophical Magazine, 29, 1081-1094.
• Top-seeded Flux Growth Of Rare-earth Vanadates
  
  Smith, S., Garton, G., & Tanner, B. (1974). Top-seeded Flux Growth Of Rare-earth Vanadates. Journal of Crystal Growth, 23, 335-340.
• Deformation Studies Of Initially Dislocation-free Copper Single-crystals .1. Constant Strain-rate Tensile Test
  
  Kamada, K., & Tanner, B. (1974). Deformation Studies Of Initially Dislocation-free Copper Single-crystals .1. Constant Strain-rate Tensile Test. Philosophical Magazine, 29, 309-322.
• Line Defects In Barium-titanate Observed By Polarized-light Microscopy
  
  Fathers, D., & Tanner, B. (1973). Line Defects In Barium-titanate Observed By Polarized-light Microscopy. Philosophical Magazine, 28, 749-770.
• X-ray Topographic Studies Of Dislocation Contrast In Silicon After Boron Diffusion
  
  Tanner, B. (1973). X-ray Topographic Studies Of Dislocation Contrast In Silicon After Boron Diffusion. Journal of Applied Crystallography, 6, 31-38.
• Dislocation-free Silver Single-crystals Grown By Czochralski Method
  
  Tanner, B. (1973). Dislocation-free Silver Single-crystals Grown By Czochralski Method. Zeitschrift Fur Naturforschung A: A Journal of Physical Sciences, A 28, 676-.
• Optical Contrast Of Inclined Boundaries In Birefringent Magnetic Materials
  
  Fathers, D., & Tanner, B. (1973). Optical Contrast Of Inclined Boundaries In Birefringent Magnetic Materials. Philosophical Magazine, 27, 17-34.
• X-ray And Optical Observations Of Natural Fluorite
  
  Tanner, B. (1972). X-ray And Optical Observations Of Natural Fluorite. Physica Status Solidi (a), 14, K9-.
• Perfection Of Czochralski Grown Copper Single-crystals
  
  Tanner, B. (1972). Perfection Of Czochralski Grown Copper Single-crystals. Journal of Crystal Growth, 16, 86-.
• Nearly Perfect Single-crystals Of Layer Compounds Grown By Iodine Vapor-transport Techniques
  
  Rimmingt.hp, B. A., & Tanner, B. (1972). Nearly Perfect Single-crystals Of Layer Compounds Grown By Iodine Vapor-transport Techniques. Journal of Crystal Growth, 15, 51-.
• Dislocation Contrast In X-ray Topographs Of Very Thin Crystals
  
  Tanner, B. (1972). Dislocation Contrast In X-ray Topographs Of Very Thin Crystals. Physica Status Solidi (a), 10, 381-.
• Display Of X-ray Topographic Images Using A Channel Plate
  
  Parpia, D., & Tanner, B. (1971). Display Of X-ray Topographic Images Using A Channel Plate. Physica Status Solidi (a), 6, 689-.
• High resolution divergent-beam X-ray topography
  
  Tanner, B. K., & Humphreys, C. J. (1970). High resolution divergent-beam X-ray topography. Journal of Physics D: Applied Physics, 3(7), 1144-1146. https://doi.org/10.1088/0022-3727/3/7/421
• Preparation And Characterization Of The Mixed 1,3,2,4-dithiadiazolylium/1,2,3,5-dithiadiazolylium Salts And Related Free-radicals - [m-snsnc-c6h4-cnssn]x And [p-snsnc-c6h4-cnssn]x (x = 2+, .+ Or 2.)
  
  Banister, A., Lavender, I., Rawson, J., Clegg, W., Tanner, B., & Whitehead, R. (n.d.). Preparation And Characterization Of The Mixed 1,3,2,4-dithiadiazolylium/1,2,3,5-dithiadiazolylium Salts And Related Free-radicals - [m-snsnc-c6h4-cnssn]x And [p-snsnc-c6h4-cnssn]x (x = 2+, .+ Or 2.). Dalton Transactions., 1421-1429.
• Studies On Pi-acceptor Molecules Containing The Dicyanomethylene Group - X-ray Crystal-structure Of The Charge-transfer Complex Of Tetramethyltetrathiafulvalene And 2,3-dicyano-1,4-naphthoquinone - (tmttf)3-(dcnq)2
  
  Batsanov, A., Bryce, M., Davies, S., Howard, J., Whitehead, R., & Tanner, B. (n.d.). Studies On Pi-acceptor Molecules Containing The Dicyanomethylene Group - X-ray Crystal-structure Of The Charge-transfer Complex Of Tetramethyltetrathiafulvalene And 2,3-dicyano-1,4-naphthoquinone - (tmttf)3-(dcnq)2. Journal of the Chemical Society. Perkin Transactions II., 313-319.
• Synthesis And Characterisation Of Three Group 10 Metal Dithiadiazolyl Complexes
  
  Banister, A., Gorrell, I., Howard, J., Lawrence, S., Lehman, C., May, I., Rawson, J., Tanner, B., Gregory, C., Blake, A., & Fricker, S. (n.d.). Synthesis And Characterisation Of Three Group 10 Metal Dithiadiazolyl Complexes. Dalton Transactions., 377-384.
• Principles And Performance Of A Multi-axis, Direct Drive X-ray Diffractometer For The Characterisation Of Advanced Materials
  
  Loxley, N., Gray, T., Tanner, B., & Bowen, D. (n.d.). Principles And Performance Of A Multi-axis, Direct Drive X-ray Diffractometer For The Characterisation Of Advanced Materials. AIP Conference Proceedings, 672-677.
• Critical Thickness Of Quantum-well Structures: Modified Matthews-blakeslee Formula And Experimental Support Gathered By Means Of Synchrotron X-ray Reflection Topography
  
  Mock, P., Tanner, B., Lacey, G., Whitehouse, C., & Smith, G. (n.d.). Critical Thickness Of Quantum-well Structures: Modified Matthews-blakeslee Formula And Experimental Support Gathered By Means Of Synchrotron X-ray Reflection Topography. Institute of Physics Conference Series., 165-168.
• Dislocation Bundles In Gaas Substrates: Assessed By X-ray And Makyoh Topography, X-ray Diffraction, Tem, Scanning Infrared Polariscopy, Light Interferometry, And Nomarski Microscopy
  
  Mock, P., Fukuzawa, M., Laczik, Z., Smith, G., Booker, G., Yamada, M., Herms, M., & Tanner, B. (n.d.). Dislocation Bundles In Gaas Substrates: Assessed By X-ray And Makyoh Topography, X-ray Diffraction, Tem, Scanning Infrared Polariscopy, Light Interferometry, And Nomarski Microscopy. Institute of Physics Conference Series., 67-72.
• X-ray Scattering For Semiconductor Characterisation
  
  Tanner, B. (n.d.). X-ray Scattering For Semiconductor Characterisation. Semiconductor Characterization - Present Status And Future Needs, 263-272.
• The Distribution Of Lattice Strain And Tilt In Lec Semi-insulating Gaas Measured By Double Crystal X-ray Topography
  
  Barnett, S., Brown, G., & Tanner, B. (n.d.). The Distribution Of Lattice Strain And Tilt In Lec Semi-insulating Gaas Measured By Double Crystal X-ray Topography. Institute of Physics Conference Series., 615-620.
• X-ray Scattering Studies Of Charge Stripes In Manganites And Nickelates
  
  Su, Y., Du, C., Tanner, B., Hatton, P., Collins, S., Brown, S., Paul, D., & Cheong, S. (n.d.). X-ray Scattering Studies Of Charge Stripes In Manganites And Nickelates. Stripes And Related Phenomena, 473-480.
• The First Solid-state Paramagnetic 1,2,3,5-dithiadiazolyl Radical - X-ray Crystal-structure Of [p-ncc6f4cnssn]center-dot
  
  Banister, A., Bricklebank, N., Clegg, W., Elsegood, M., Gregory, C., Lavender, I., Rawson, J., & Tanner, B. (n.d.). The First Solid-state Paramagnetic 1,2,3,5-dithiadiazolyl Radical - X-ray Crystal-structure Of [p-ncc6f4cnssn]center-dot. Journal of the Chemical Society, Chemical Communications, 679-680.
• Computer-simulation Of X-ray Topographs Of Curved Silicon-crystals
  
  Green, G., & Tanner, B. (n.d.). Computer-simulation Of X-ray Topographs Of Curved Silicon-crystals. Institute of Physics Conference Series., 627-632.

Other (Print)

• Spin-out, licence or collaborate: The Knowledge Transfer Dilemma
  
  Tanner, B. (2018). Spin-out, licence or collaborate: The Knowledge Transfer Dilemma (pp. 24-27). Magnews - The International Publication of the Magnetics Society.